Three-Dimensional Measuring Apparatus, Three-Dimensional Measuring Method, And Three-Dimensional Measuring Program

[0020](1) The pattern of light formed by the pattern forming means is projected onto a measurement object by the projecting means, an image of the measurement object illuminated with the pattern of light is captured by the imaging means, and a projected pattern of light is detected on this image by the projected pattern light detection means. It is thus possible to obtain many pieces of information on a projected pattern of light by a single projection. Additionally, the direction angle computing means computes the direction angle of each individual pattern of light in the projected pattern of light, and the dividing means divides the projected pattern of light at every cycle. The phase value computing means computes the phase value at each measuring point of an individual pattern of light or a divided projected pattern of light, and the computed phase value at each measuring point is converted into the depth distance of each measuring point. It is thus possible to obtain three-dimensional information not only on one measuring point, at which the intensity distribution of each individual pattern of light in the projected pattern of light takes on a relative maximum, but also on each measuring point of an individual pattern of light. Thus, highly accurate three-dimensional information can be provided.

[0021](6) Since the pattern that is used with the three-dimensional measuring apparatus of the present invention is formed in the shape of stripes. It is thus possible to readily analyze, as a sine wave, the intensity distribution of a projected pattern of light used for analysis.

However, because laser light is likely to have adverse effects on the human body, these methods are difficult to apply to the human body.

However, a reduction in the intensity of laser light, in turn, requires an increase in the time of exposure to it, thereby resulting in the total amount of laser light being increased.