Method and device for determining infrared characteristic influence parameters of ship

The invention relates to a method and a device for determining ship infrared characteristic influence parameters. The method comprises the following steps of: pre-establishing a relation equation among effective infrared radiation data of each surface element on a ship target, a plurality of environment parameters and a plurality of to-be-solved parameters; acquiring n * m groups of test data of corresponding surface elements of the vessel target in an actual scene; inputting each m groups of test data into the relation equation to obtain a group of nonlinear constraint equations taking a plurality of to-be-solved parameters as variables, and solving each group of nonlinear constraint equations by adopting a Newton method to obtain a corresponding group of to-be-solved parameter estimated values; and calculating a confidence interval of each to-be-solved parameter according to the n groups of estimated values of the to-be-solved parameters, determining an estimated value falling in the corresponding confidence interval in the n estimated values of each to-be-solved parameter, and determining a target value corresponding to the to-be-solved parameter according to the estimated value falling in the corresponding confidence interval in the n estimated values of each to-be-solved parameter. The accuracy of the to-be-solved parameters can be improved.