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1 results about "Sem analysis" patented technology

SEM Analysis with EDS Capabilities. Scanning Electron Microscopy (SEM) is a test process that scans a sample with an electron beam to produce a magnified image for analysis. The method is also known as SEM analysis and SEM microscopy, and is used very effectively in microanalysis and failure analysis of solid inorganic materials.

Data synchronization method and device

ActiveCN110019504AImprove synchronization efficiencyEnsure consistencyWeb data indexingDatabase distribution/replicationSem analysisTarget database
The invention provides a data synchronization method and device which are applied to a search engine marketing SEM analysis system, the SEM analysis system comprises a plurality of accounts, and the accounts respectively belong to at least one account group. The method includes: obtaining first full-material data and second full-material data of each account in the at least one account, and determining first persistent data of each account; storing the first persistent data of each account into a shared directory; obtaining second persistent data of any account group from the shared directory;and inserting each piece of data in the second persistent data of any account group into the target database in parallel. According to the technical scheme, the high concurrency performance of multiple accounts in the data production stage is fully utilized, the consistency of the first persistent data of all the accounts and the first full material data is guaranteed, the data storage efficiencyis improved, and then the data synchronization efficiency is improved on the whole.
Owner:BEIJING GRIDSUM TECH CO LTD
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