Chip-based side channel leakage analysis system and method

A leakage analysis and side channel technology, applied in electronic circuit testing and other directions, can solve the problems of low accuracy and low signal-to-noise ratio, and achieve the effect of comprehensive safety assessment and improved accuracy

Pending Publication Date: 2018-03-09
NATIONZ TECH INC
View PDF0 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented device has two main benefits - it uses small probes that change how much data flows into or out of each piece of equipment on an integrated circuit board without affecting its performance. It also analyzes route information about specific points within the chip's interior instead of relying solely upon external sources like voltage fluctuations caused by environmental factors such as temperature variations. By analyzing these routes, this innovation improves the ability to detect attacks against sensitive components while minimizing impacted signals during their operation. Additionally, there may be optional safety features available to protect certain parts of the chip based on current methods used only when they were designed correctly.

Problems solved by technology

Technological Problem: Current Dual Attack Analysis Methodologies For Improving Security Layer Chip Threat Modeling Challenge Protocol Overall, there exists technical problem addressed through these techniques where hackers can easily compromve an encrypted part inside their own devices without being detected until they leave production facilities again.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip-based side channel leakage analysis system and method
  • Chip-based side channel leakage analysis system and method
  • Chip-based side channel leakage analysis system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0032] The invention discloses a chip-based side channel leakage analysis system, specifically as figure 1 shown. The system mainly includes: a chip carrier 1 , a probe holder 2 , a probe 3 , an information collection module 4 and a workstation 5 .

[0033] In this embodiment, the chip carrier 1 is used to carry the chip 6 to be tested.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a chip-based side channel leakage analysis system and method. The system comprises a chip carrier, a probe seat, a probe, an information acquisition module and a workstation. The chip carrier is used for carrying a chip to be tested, the probe seat is used for carrying the probe, and the probe is used for obtaining information leakage of a target trace inside the chip to betested. The information acquisition module is connected with the probe and used for acquiring information leakage obtained by the probe. The workstation is connected with the information acquisitionmodule and used for processing and analyzing the information leakage acquired by the information acquisition module. The side channel leakage analysis system and method introduce the probe, and directly obtain the information leakage of the target trace inside the chip through the probe. Thus, the accuracy of an attack and the signal-to-noise ratio of the obtained curve can be improved, and certain security measures can be selectively bypassed to achieve a more comprehensive security assessment with practical operability.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner NATIONZ TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap