One-dimensional X-ray multi-layer film waveguide structure and preparation method thereof

A technology of waveguide structure and multilayer film, which is applied in the field of one-dimensional X-ray multilayer film waveguide structure and its preparation, can solve the problems of X-ray loss and low transmittance, so as to improve the focus signal-to-noise ratio, ensure transmittance, Guaranteed concentrated effect of X-ray intensity

Active Publication Date: 2018-08-10
上海米蜂激光科技有限公司
View PDF5 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The reason is that there is a large amount of loss of X-ra

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • One-dimensional X-ray multi-layer film waveguide structure and preparation method thereof
  • One-dimensional X-ray multi-layer film waveguide structure and preparation method thereof
  • One-dimensional X-ray multi-layer film waveguide structure and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0049] The molybdenum / carbon non-periodic multilayer film is prepared by DC magnetron sputtering technology (Wang Fengli, Wang Zhanshan, Zhang Zhong, Wu Wenjuan, Wang Hongchang, Zhang Shumin, Qin Shuji, Chen Lingyan, 13 (2005) 28-33), ( Xu Yao, Wang Zhanshan, Xu Jing, Zhang Zhong, Wang Hongchang, Zhu Jingtao, Wang Fengli, Wang Bei, Qin Shuji, Chen Lingyan, 15 (2007) 1838-1843). Molybdenum thin film layers and carbon thin films are alternately deposited on germanium substrates to obtain molybdenum / carbon non-periodic multilayer film samples.

[0050] After the obtained molybdenum / carbon aperiodic multilayer film is further processed, the X-ray multilayer film waveguide is prepared. The steps are as follows, see attached figure 2 , Step A, deep processing the obtained multilayer film sample, and plating an anti-electron beam film on the sample film; Step B, using electron beam etching (E-beam) to etch a fixed width Lc at a specific position; Step C , Use ion beam etching (Reac

Example Embodiment

[0056] Example 1

[0057] First, solve the relationship between the wave-derived emission phase and the thickness of a single conducting layer. Set this X-ray multilayer film waveguide to work at 19.9 keV energy, according to the calculation method of X-ray propagation in a single channel (C. Fuhse, T. Salditt, Physica B, 357 (2005) 57-60), by The Helmholtz equation of the ray at the entrance of the waveguide is solved, and the relationship formula between the propagation constant β and the thickness d of the guiding layer is obtained. , Where k0 is the wave vector in vacuum, n1 is the refractive index of the carbon film, and ξ is the characteristic value of the Helmholtz equation. Use Taylor's formula to expand this formula to obtain the relationship between the small thickness Δd and the small propagation constant Δβ.

[0058]

[0059] among them Is the waveguide parameter, n1 is the refractive index of the carbon film, n2 is the refractive index of the molybdenum film, β0 is the

Example Embodiment

[0066] Example 2

[0067] First, solve the relationship between the wave-derived emission phase and the thickness of a single conducting layer. Set this X-ray multilayer film waveguide to work at an energy of 19.9 keV, according to the calculation method of X-ray propagation in a single channel (C. Fuhse, T. Salditt, Physica B, 357 (2005) 57-60), by comparing X The Helmholtz equation of the ray at the entrance of the waveguide is solved, and the relationship formula between the propagation constant β and the thickness d of the guiding layer is obtained. , Where k0 is the wave vector in vacuum, n1 is the refractive index of the carbon film, and ξ is the characteristic value of the Helmholtz equation. Use Taylor's formula to expand this formula to obtain the relationship between the small thickness Δd and the small propagation constant Δβ.

[0068]

[0069] among them Is the waveguide parameter, n1 is the refractive index of the carbon film, n2 is the refractive index of the molybde

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Lengthaaaaaaaaaa
Lengthaaaaaaaaaa
Lengthaaaaaaaaaa
Login to view more

Abstract

The invention relates to the technical field of precision optical components, in particular to a one-dimensional X-ray multi-layer film waveguide structure and a preparation method thereof. The waveguide structure comprises a base, a top substrate and a molybdenum/carbon aperiodic multi-layer film arranged between the base and the top substrate, the molybdenum/carbon aperiodic multi-layer film iscomposed of staggeredly arranged molybdenum thin film layers and carbon thin film layers, a clearance is formed in the surface of the side, relative to the top substrate, of the molybdenum/carbon aperiodic multi-layer film, and the molybdenum/carbon aperiodic multi-layer film is separated into a first waveguide layer and a second waveguide layer. Compared with the prior art, the input aperture ofX-ray can be improved by utilizing multiple conductive layers in the multi-layer film, and the size of a focus can be changed and background noise can be reduced by utilizing the lengths and etching lengths of the first waveguide layer and the second waveguide layer to further improve the focusing performance of the waveguide focus of the X-ray, and the design provides an effective method for further expanding extensive application of the X-ray multi-layer film waveguide.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner 上海米蜂激光科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products