Integrated Modular Integrated Circuit Test Fixture and Handler Interface

[0004]In one embodiment, an integrated circuit (IC) test fixture includes a plurality of sockets. An alignment plate is coupled to the sockets and configured to provide alignment between an IC handler and the IC test fixture. One or more manual test lids is removably coupled to the alignment plate, the one or more manual test lids coupled to the alignment plate for manual testing one or more integrated circuits, the manual test lids removed from the alignment plate for use of the IC test fixture with the test handler.

[0005]In another embodiment an integrated circuit (IC) test fixture includes a device interface board and a plurality of daughter card subassemblies for receiving integrated circuits for testing, the plurality of daughter card subassemblies coupled to the device interface board. Each daughter card subassembly includes a daughter card, a plurality of sockets coupled to the daughter card, and an alignment plate to provide alignment between an IC handler and respective ones o