2 results about "File transfer" patented technology

The invention discloses an FTP (file transfer protocol) file transfer method based on asynchronous read-write and an FTP client and relates to the field of FTP configuration. The method comprises the following steps: the FTP client acquires FTP file sizes locally according to FTP file information needing to be read or written; FTP files are split into a plurality of read-write data blocks according to the file sizes; the FTP client sends an asynchronous file read-write request message to a message drive framework, and the message drive framework acquires a read-write worker thread in a preset thread pool; data blocks needing to be read or written in the FTP files are read by means of the read-write worker thread according to the asynchronous file read-write request message. According to the method, basic functions of FTP cannot be affected while high efficiency of the message drive framework is guaranteed, FTP is brought into the message drive type software framework perfectly, and the method is quite suitable for being popularized.

The invention relates to the technical field of semiconductor manufacturing and computers, and discloses a semiconductor wafer acceptability-based test method, which comprises the following steps of: transmitting a data file generated by a test machine to a file temporary storage system in real time through a file transfer protocol; reading and analyzing all the files into the database within the time period, and deleting the files after the read files are stored; presetting a task request; according to the formulated data judgment task request, obtaining judged wafer batch test data, presetting an activation rule, performing combined judgment on the wafer batch test data according to the activation rule, and obtaining a judgment result; and feeding back a judgment result to the manufacturing execution management system, performing automatic station crossing, and providing a report interface according to the judgment result to display to a user for viewing. The invention further provides a testing system based on the acceptability of the semiconductor wafer. The processing design and implementation of a mass data set during wafer acceptability testing in the semiconductor manufacturing process are achieved.