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2 results about "Space requirements" patented technology

Three-dimensional calibrating measurement device for neutron diffraction stress analysis

PendingCN106770402ASmall space requirementRealize accurate 3D calibrationMaterial analysis using wave/particle radiationStress measurementMeasurement device
The present invention provides a three-dimensional calibrating measurement device for neutron diffraction stress analysis. The three-dimensional calibrating measurement device can move with multi-degree of freedom by utilizing a three-dimensional scanner matched with a sample table firstly; scanning images of samples on the sample table are collected into a computer for building a three-dimensional model of each sample; sub-net treatment is performed on each three-dimensional model, and each net grid is allocated with a unique identification; any target net grid is selected from the three-dimensional model in a manual or automatic mode, the movement of the sample table is controlled by a movement control program set in the computer, so as to enable an entrance slit to be aligned to the corresponding target net grid, at the same time, each diffraction slit, a corresponding collimator and a corresponding neutron detector move to corresponding positions, a neutron source emits a neutron beam, and neutron diffraction stress measurement is started. The three-dimensional calibrating measurement device can be used for achieving precise three-dimensional calibrating on the samples, is low in space requirement, and free of additional installation of datum mark light sources, avoids introduction of additional errors, and can reach the position accuracy up to 100 mu m for detected samples.
Owner:INST OF NUCLEAR PHYSICS & CHEM CHINA ACADEMY OF
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