2 results about "Test input" patented technology

A circuit measuring the operating speed of a semiconductor memory chip in relation to a defined asynchronous access time is disclosed. The circuit includes a test signal path extending between a test input pad and a test output pad and is formed by a plurality of test signal path segments and at least one delay element associated with at least one of the plurality of test signal path segments, such that a delay time for a test signal communicated through the test signal path is indicative of the actual asynchronous access time for the semiconductor memory chip. Each one of the plurality of test signal path segments is either an interior test signal path segment or an exterior test signal path segment.

A method for enhance input stability and compatibility of IOS automated t is disclosed, At that start of the input, the IOS system version is jud, determine if the IOS system version is greater than or equal to 10.3, Whether it is less than 10.3 or not, different methods are adopted to perform the purge operation and input operation automatically according to different versions of the system, which can ensure that no matter what type of IOS input box is, the input operation in the automated test can be stably completed, so as to be compatible with different versions of the IOS system.