Calibration method and system of test system

A test system and calibration method technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problem that the measurement data of the device under test cannot be accurately reflected

Active Publication Date: 2016-09-28
BEIJING RUNKE GENERAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Benefits of technology

This technology allows testing devices with different levels of performance during their operation without having them stop working altogether or requiring expensive equipment. By controlling signals sent by one unit (the control) through another unit called the tester's input port, it generates various types of measurements on these units while they work together effectively. These tests allow researchers to study how well each component works over time when combined properly.

Problems solved by technology

The technical problem addressed in this patented text relates to improving the accuracy of microwaves' measurements during high-power tests (HPT) with lower levels of noise interference from sources like signals transmitted over wires that are being measured.

Method used

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  • Calibration method and system of test system

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Embodiment Construction

[0049] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0050] Before introducing the specific implementation of the present invention, first introduce the realization principle of the present invention, the present invention uses the signal source to output the source signal, after the power amplification device and the test system, it is connected to the measuring instrument, and the test system is measured after calculation. Insertion loss data, therefore, after the test system is calibrated using the insertion loss

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Abstract

The invention provides a calibration method and system of a test system. The method comprises the following steps: controlling a signal source to enable a source signal to be input to a system input end of the test system, and enable the source signal to be input to a power amplification device through the input end of a device under test of the test system, wherein the power amplification device is used for carrying out amplification processing on the source signal to generate an amplification signal; and controlling a measuring instrument to read a first output signal at the system output end of the test system, calculating first insertion loss data of the test system according to the source signal, the first output signal and nominal value data of the power amplification device, and carrying out high-power calibration on the test system according to the first insertion loss data. The calibration method and system can calibrate the test system under large power, and can obtain the measurement data of the device under test in a large power state.

Description

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Claims

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Application Information

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Owner BEIJING RUNKE GENERAL TECH
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