A method for automatically counting the ear rate of wheat scab

A technology of wheat scab and a statistical method is applied in the field of automatic statistics of wheat scab disease and ear rate, which can solve the problem of difficult identification of scab images, and achieve the effect of improving the level of intelligence and increasing the accuracy of judgment.

Active Publication Date: 2018-12-25
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
View PDF11 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the defects in the prior art that scab images are easily affected by background, light and oc

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0054] In order to have a further understanding and understanding of the structural features of the present invention and the achieved effects, the preferred embodiments and drawings are used in conjunction with detailed descriptions, which are described as follows:

[0055] Such as figure 1 As shown, the method for automatically counting the diseased ear rate of wheat head blight according to the present invention includes the following steps:

[0056] The first step is the acquisition and preprocessing of wheat head blight images. Obtain several images of wheat head blight, and obtain the average temperature, precipitation and number of rainy days in the current month of the image as climate factors, and the images of wheat head blight and climate factors as training samples.

[0057] The second step is to construct a wheat head detection model for wheat scab image. Construct a deep convolutional neural network incorporating climate factors.

[0058] The deep convolutional neural netw

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A method for automatically counting the ear rate of wheat scab features that the image of wheat scab is easily affected by background, and the influence of illumination and shade is difficult to be recognized, compared with the prior art. The invention comprises the following steps: acquiring and preprocessing the wheat scab image; construction of Wheat Spike Detection Model Based on Wheat Scab Image; training depth convolution neural network; collection and preprocessing of Wheat Fusarium Head Blight Images; counting of normal ear and diseased ear; calculating the rate of diseased panicle. The invention realizes the automatic statistics of wheat scab ear rate through the machine vision method, and improves the intelligence level, robustness and detection precision of wheat scab ear rate statistics.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products