Abnormal measurement recognition control method, computer equipment and storage medium

一种控制方法、异常识别的技术,应用在制造计算系统、电视、电气元件等方向,能够解决影响摄像头正常生产、基板易松动等问题,达到保证正常检测与生产的效果

Active Publication Date: 2022-05-20
UNIV OF ELECTRONIC SCI & TECH OF CHINA CHENGDU COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing production process, the substrate of the standard camera center is usually made manually according to the standard camera. Due to the variety of substrates and the substrate is easy to loose, it is likely that the normal camera will be judged as a measurement during the consistency detection process of the camera center. Abnormal camera, affecting the normal production of the camera

Method used

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Embodiment Construction

[0045] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0046] It can be understood that, in the prior art, the consistency detection in the camera production is usually based on the standard camera to manually manufacture the substrate of the standard camera center. Since there are many types of substrates and the substrate is easy to loosen, the consistency detection in the camera center is caused. During the process, a normal camera may be judged as a camera with abnormal measurement, which will affect the normal production of the camera.

[0047] In order to solve the above problems, the embodiment of the present invention generates and sto...

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Abstract

The embodiment of the invention relates to the technical field of quality detection, and particularly discloses a measurement anomaly identification control method, computer equipment and a storage medium. According to the embodiment of the invention, a plurality of standard cameras are subjected to camera center marking, and a plurality of corresponding standard camera centers are generated and stored; generating a center measurement difference value of the production camera, and marking the production camera as an abnormal camera when the center measurement difference value is greater than a preset abnormal difference value; marking a plurality of continuously appearing abnormal cameras as suspicious cameras; and performing anomaly detection, when the standard camera center is abnormal, re-marking the standard camera center, and marking the plurality of suspicious cameras as undetected cameras. According to the method, in the consistency detection process of the camera shooting center, the abnormal cameras can be marked, measurement abnormity identification judgment is carried out according to the continuous occurrence number of the abnormal cameras, corresponding processing is carried out when measurement abnormity occurs, and normal detection and production of the cameras are guaranteed.

Description

technical field [0001] The invention belongs to the technical field of quality detection, and in particular relates to a measurement abnormality identification control method, a computer device and a storage medium. Background technique [0002] In the production process of the camera, it is usually necessary to perform the camera center consistency test on the camera to ensure that each qualified camera camera center is consistent with the standard camera center. In the existing production process, the substrate of the standard camera center is usually made manually according to the standard camera. Due to the variety of substrates and the easy loosening of the substrate, the normal camera is likely to be judged as the measurement during the consistency inspection of the camera center. Abnormal camera, affecting the normal production of the camera. SUMMARY OF THE INVENTION [0003] The purpose of the embodiments of the present invention is to provide a measurement abnorm...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
CPCH04N17/002Y02P90/30
Inventor 舒晓苓
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA CHENGDU COLLEGE
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