Method for detecting a mass density image of an object
a mass density image and object technology, applied in material analysis using wave/particle radiation, instruments, nuclear engineering, etc., can solve the problems of limited acceptance of dei by radiologists and loss of good absorption-based radiographs, and achieve better signal-to-noise ratios, reduce x-ray doses, and reduce radiation doses
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[0025] One method of this invention provides a mass density image of an object. The mass density image shows contrast features of an object, similar to conventional radiography, without relying on the absorption of x-rays by the object. The mass density image of an object is obtained through an image processing algorithm used on images based on refraction characteristics of the object, such as refraction images obtained by Diffraction Enhanced Imaging (DEI). The mass density image of this invention can be obtained through DEI such as, for example, the x-ray imaging method disclosed in U.S. Pat. No. 5,987,095 issued to Chapman et al. and / or in U.S. Pat. No. 6,577,708 issued to Chapman et al., the entire disclosures of which are incorporated into this specification by reference.
[0026]FIG. 1 shows a schematic diagram of an analyzer system 10, according to one preferred embodiment of this invention. FIG. 1 is similar to the crystal analyzer system shown in FIG. 1 of U.S. Pat. No. 5,987,
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