Method and system for a process sensor to compensate soc parameters in the presence of IC process manufacturing variations

[0019]Certain embodiments of the invention may be found in a method and system for a process sensor to compensate SoC parameters in the presence of IC process manufacturing variations. Certain aspects of the invention may comprise determining an amount of process variation associated with at least one transistor within a single integrated circuit. The determined amount of process variation may be compensated by utilizing a process dependent current, a bandgap current, and a current associated with a present temperature of the transistor. The process dependent current, the bandgap current and the current associated with the present temperature of the transistor may be combined to generate an output current. A voltage generated across a variable resistor may be determined based on the generated output current.

[0020]FIG. 1 is a block diagram of a process sensor in accordance with an embodiment of the invention. Referring to FIG. 1, there is shown a single integrated chip 100 comprising a