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1 results about "Damping factor" patented technology

In an audio system, the damping factor gives the ratio of the rated impedance of the loudspeaker to the source impedance. Only the resistive part of the loudspeaker impedance is used. The amplifier output impedance is also assumed to be totally resistive. The source impedance (that seen by the loudspeaker) includes the connecting cable impedance. The load impedance Zₗₒₐd (input impedance) and the source impedance Zₛₒᵤᵣcₑ (output impedance) are shown in the diagram.

Method and apparatus for measuring temporal response characteristics of digital mirror devices

InactiveUS7095494B2Accurate measurementAngle measurementPhase-affecting property measurementsDamping factorPhotodetector
A method and system for measuring the temporal response of a micromirror array to a variety of driving signals. A micromirror array is illuminated with a coherent light source so that a diffraction pattern is reflected from the micromirror array. One or more photodetectors are aligned with spots of light in the diffraction pattern that correspond to orders of the diffraction pattern. Diffraction pattern theory predicts that the intensity of these spots of light will vary as the tilt angle of the micromirrors is changed. Thus, by measuring the relative intensity of the spots of light as the micromirror array is provided with a variety of driving signals, many performance characteristics of the micromirror array can be measured. Some of these characteristics include the impulse response, the forced resonant frequency (i.e. the natural frequency), the damped resonant frequency, the quality factor of the micromirror response, the damping factor of the micromirror response, and the frequency transfer function. According to another aspect of the invention, the electromechanical compliance of the micromirrors in the micromirror array can also be measured. It is further contemplated that all of these measurements can be localized to specific regions on the surface of the micromirror array so that the variance of different characteristics across its surface can be analyzed. Another aspect of the disclosed invention is the measurement of the tilt angle of the micromirror array at a non-biased state.
Owner:TEXAS INSTR INC

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