10 results about "Diffraction" patented technology

A negative electrode current collector for a non-aqueous electrolyte secondary battery comprising copper or a copper alloy, characterized in that the copper or copper alloy has a ratio I200/I111 of an intensity I200 of a peak attributed to (200) plane to an intensity I111 of a peak attributed to (111) plane, which satisfies the equation (1): 0.3<=I200/I111<=4.0 (1) in an X-ray diffraction pattern measured using CuKalpha radiation as a radiation source.

The present invention provides a three-dimensional calibrating measurement device for neutron diffraction stress analysis. The three-dimensional calibrating measurement device can move with multi-degree of freedom by utilizing a three-dimensional scanner matched with a sample table firstly; scanning images of samples on the sample table are collected into a computer for building a three-dimensional model of each sample; sub-net treatment is performed on each three-dimensional model, and each net grid is allocated with a unique identification; any target net grid is selected from the three-dimensional model in a manual or automatic mode, the movement of the sample table is controlled by a movement control program set in the computer, so as to enable an entrance slit to be aligned to the corresponding target net grid, at the same time, each diffraction slit, a corresponding collimator and a corresponding neutron detector move to corresponding positions, a neutron source emits a neutron beam, and neutron diffraction stress measurement is started. The three-dimensional calibrating measurement device can be used for achieving precise three-dimensional calibrating on the samples, is low in space requirement, and free of additional installation of datum mark light sources, avoids introduction of additional errors, and can reach the position accuracy up to 100 mu m for detected samples.

The present invention relates to an aluminum alloy brazing sheet (1) for a heat exchanger improved in a life including a fatigue in a plastic area and an aluminum alloy heat exchanger tube (11) using the brazing sheet, which is composed of: a core material (2) of an Al—Mn series alloy; a skin material (3) of any one of an Al—Zn series alloy, an Al—Zn—Mg series alloy, an Al—Si—Mn—Zn series alloy, and an Al—Si—Mn—Mg—Zn series alloy clad on one side of the core material; and a brazing material (4) of an Al—Si series alloy clad on the other side of the core material, and is adapted so that an X-ray diffraction intensity ratio of the aluminum alloy brazing sheet satisfies a relational expression of I200/(I111+I200+I220+I311)≧0.4.

A surface-treated steel sheet includes a steel sheet; and a plating layer which is formed on one surface or both surfaces of the steel sheet and which includes zinc and one of the group consisting of vanadium and zirconium, wherein the plating layer includes dendrite-shaped crystals including metallic zinc, and intercrystal filling regions which fill spaces between the dendrite-shaped crystals and show amorphous diffraction patterns when electron beam diffraction is carried out, wherein when the plating layer includes the vanadium, the intercrystal filling regions include a hydrated vanadium oxide or a vanadium hydroxide, and, wherein when the plating layer includes zirconium, the intercrystal filling regions include a hydrated zirconium oxide or a zirconium hydroxide.

The invention discloses a large-gradient free hook face measurement method. The method comprises the following steps that: applying a certain angle to a free hook face to be measured to finish the spatial frequency modulation of a free curve diffraction object light wave, and collecting by an image sensor; regulating a plurality of angles, recording multiple frames of holograms of which the free hook faces have different angles, then, through an image processing algorithm, finishing selecting the stripe sparse subarea of each frame of hologram, and recovering the subarea three-dimensional structure of the modulated free hook face to be measured through a digital reconstruction algorithm; and finally, according to a demodulation algorithm, recovering the subarea three-dimensional structureof the original free hook face to be measured, utilizing a proper stitching algorithm to realize the wavefront data fitting of multiple frames of subareas, and therefore, recovering the three-dimensional surface shape information of the free hook face. Through the introduction of an inclination angle, the collection process of free hook face high-frequency information is realized, and a new solution is provided for free hook face measurement.

The invention discloses a device for lowering transmission loss in a feeder tube. The device has the characteristics that the device comprises an interface waveguide tube, a butt joint waveguide tube and a dust blocking net, wherein the head end of the interface waveguide tube is provided with an interface flange, the end surface of the interface flange is provided with at least one annular slot, the diameter of the annular sealing slot is greater than the diameter of a wedge-shaped annular slot, and an insulator filling material is arranged in one annular slot; the head end of the butt joint waveguide tube is provided with a butt joint flange, and the end surface of the butt joint flange is flat; and the dust blocking net is arranged between the end surface of the butt joint flange and the end surface of the interface flange, and the butt joint flange and the interface flange are fixed through a plurality of fasteners. When the device for lowering the transmission loss in the feeder tube is used, the diffraction and the leakage of electromagnetic wave on the butt joint flange interface in a waveguide tube transmission process can be effectively avoided, and transmission power is protected from losses so as to guarantee the transmission efficiency and the transmission safety of the waveguide tube.

Methods for determining the 3-D structures of proteins. Such a method includes incorporating a compound into a protein crystal such that the compound enhances the activity of the protein crystal to second harmonic generation, illuminating the protein crystal with a sufficiently intense light to cause second harmonic generation by the protein crystal, and detecting a second harmonic generation response produced by the protein crystal that is suitable for protein structure determination by diffraction analysis.