The invention discloses an
aging test system for switch power supplies. The
aging test system comprises a
circuit breaker connected with a mains supply, at least one group of test arrays connected with the
circuit breaker and an inversion feedback unit connected with both the test arrays and the mains supply, wherein the test arrays comprise at least one group of switch power supply combination units; each switch power supply combination unit comprises a plurality of switch power supplies; the input ends of the multiple switch power supplies are connected in parallel to be the input end of the corresponding switch power supply combination unit; the output ends of the switch power supplies are connected in series to be the output end of the corresponding switch power supply combination unit. Therefore, one
test array is divided into a plurality of switch power supply combination units to facilitate control, and the number of compensation units can be reduced; more importantly, the inversion feedback unit inverts energy of the test arrays, and feeds back the inverted energy to the mains supply to fulfill the aim of
energy conservation.