Spot measurement equipment of light emitting diode chip

A light-emitting diode and chip technology, applied in the semiconductor field, can solve the problem of high implementation cost and achieve the effect of improving accuracy

Active Publication Date: 2018-12-07
HC SEMITEK ZHEJIANG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the position of the power access interface on the receiving device is fixed, and the relative position between the light rece...

Method used

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  • Spot measurement equipment of light emitting diode chip
  • Spot measurement equipment of light emitting diode chip

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Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0037] An embodiment of the present invention provides a light-emitting diode chip point measurement device, figure 1 It is a partial structural schematic diagram of a point-testing device for a light-emitting diode chip provided by an embodiment of the present invention, as shown in figure 1 As shown, the wafer stage device includes a wafer receiver device 100, an optical path conversion device 200 and a light receiving device (not shown in the figure).

[0038] The chip carrier device 100 is used for carrying LED chips (not shown in the figure).

[0039] The optical path conversion device 200 is arranged between the substrate device 100 and the LED chip, and is used to reflect the light emitted from the LED chip to the substrate dev...

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Abstract

The invention discloses the spot measurement equipment of a light emitting diode chip and belongs to the semiconductor technology field. The spot measurement equipment comprises a bearing device, an optical path conversion device and a light collection device, wherein the bearing device is used for bearing a light emitting diode chip; the optical path conversion device is arranged between the bearing device and the light emitting diode chip and is used for reflecting light emitted to the bearing device by the light emitting diode chip to the light emitting surface of the light emitting diode chip; and the light collection device is arranged toward the light emitting surface of the light emitting diode chip and is used for detecting the optical parameters of the light emitting diode chip. The spot measurement equipment can be used for detecting the optical parameters of a positively-installed LED chip and can also be used for detecting the optical parameters of an inversely-installed LED chip. And simultaneously, the detection accuracy of the optical parameters can be increased.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a spot measuring device for light emitting diode chips. Background technique [0002] With the wide application of Light Emitting Diode (LED for short) in the fields of display and lighting, the market demand for LEDs increases geometrically, which puts forward higher requirements for the production efficiency and production quality of LEDs. [0003] In order to improve the production quality of LEDs, spot testing equipment is needed to measure the optical parameters of LED chips before the LEDs leave the factory. Common point measurement equipment usually includes: a chip receiving device and a light receiving device. The chip receiving device is used to carry the LED chip and provide an interface for the LED chip to access power; When the power is turned on, the optical parameters of the LED chip are detected. [0004] In the process of realizing the present invention,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2635
Inventor 彭功恒叶青贤向光胜喻海波
Owner HC SEMITEK ZHEJIANG CO LTD
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