Active contour model image segmentation method based on SLIC superpixel segmentation and saliency detection algorithm

An active contour model and superpixel segmentation technology, applied in image analysis, image enhancement, image data processing, etc., can solve the problems of long processing time and insufficient accuracy, and achieve good versatility, strong anti-noise ability, and calculation results. accurate effect

Pending Publication Date: 2021-08-27
GUIZHOU POWER GRID CO LTD
View PDF2 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It can overcome the problems of too many iterations of the traditional active contour model, long processing time, and insufficient accuracy. The saliency detection algorithm based on SL

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0041] A preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings. It should be understood that preferred embodiments are intended to illustrate the invention, not to limit the scope of the invention.

[0042] The present invention uses the SL1C algorithm to prepare the image. The SL1C algorithm is a more convenient segmentation algorithm, but also can split the color image, but also to the grayscale map, the image can be divided into a pixel block as the cell, more It is easy to express neighborhood characteristics of pixel point, and there is no need to set too much parameters, fast running speed, and the segmentation result can be more desirable to maintain the outline of the target in the image. The contrast between the irregular ultra-pixel blocks was then calculated to estimate the significant value to obtain a significant region, and then the spatial correlation between the obtained significant information and the pi

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an active contour model image segmentation method based on SLIC superpixel segmentation and a saliency detection algorithm. The method comprises the following steps: firstly, preprocessing an image by using an SLIC algorithm to obtain a superpixel segmentation result; for a superpixel segmentation result, calculating the contrast between irregular superpixel blocks to estimate a saliency value so as to obtain a salient region, and then the obtained salient information and the spatial correlation between pixels being subjected to weighted fusion to obtain a saliency map; then extracting a region boundary of the saliency map by using a Canny operator, and constructing an initial level set phi by taking the saliency region boundary as an initial curve. The problems of too many parameters and the like existing in an existing active contour CV model are improved, the improved active contour CV model is used for further processing an ultraviolet image, and finally an accurate and ideal ultraviolet segmentation image is obtained.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner GUIZHOU POWER GRID CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products