The invention discloses an automatic lifting device for testing minority
carrier lifetime of an end face of a polycrystalline,
single crystal or cast
single crystal small square
ingot. The method is characterized in that the device comprises a bottom plate, a guide column, a guide sleeve, a top plate, a check ring, an
infrared height tester and a vertical transmission device; the bottom plate canbe fixed on a pedestal of a conventional minority
carrier lifetime tester through bolts; the minority
carrier lifetime tester can also be directly placed on the minority carrier lifetime tester base;the four guide columns are fixed on the bottom plate; the four guide sleeves are fixed on the top plate; the upper surface of the top plate is used for placing polycrystalline, monocrystalline or castmonocrystalline small square ingots with minority carrier lifetime to be measured; the check ring is used for fixing polycrystal,
single crystal or cast single
crystal small square ingots and preventing the polycrystal, single
crystal or cast single
crystal small square ingots from sliding, the
infrared height tester is composed of a guide column, a guide sleeve and an
infrared emitting device; the infrared height is consistent with the height of a minority carrier lifetime tester probe, and the vertical transmission device can be in a hydraulic transmission mode, a pneumatic transmission mode, a screw transmission mode and the like.