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3 results about "Compensation algorithm" patented technology

Temperature and humidity nonlinear compensation method based on adaptive order adjustment nonlinear model

InactiveCN110568153AImprove Sensing PerformanceReduce measurement errorEarth material testingComplex mathematical operationsNonlinear modelComputational physics
The invention relates to a temperature and humidity nonlinear compensation method based on an adaptive order adjustment nonlinear model, comprising the following steps: (1) adding an adaptive order adjustment and feedback module on the basis of a fixed order nonlinear compensation model; (2) performing modeling and coefficient estimation on an adaptive order adjustment nonlinear model; and (3) measuring the added adaptive order adjustment and feedback module, calculating and comparing the errors of nonlinear compensation models of various orders, selecting a nonlinear equation with the minimummeasurement error for correction to obtain an optimal corrected nonlinear order. The beneficial effect is that experimental results show that the measurement precision of an adaptive order nonlinearcompensation moisture sensor of the adaptive order nonlinear compensation algorithm is remarkably improved. By combining the adaptive nonlinear order nonlinear compensation technology with a temperature and humidity integrated sensor, the humidity measurement precision of the sensor is greatly improved.
Owner:ZHEJIANG UNIV CITY COLLEGE

Hysteresis modeling and end-to-end compensation method based on gating cycle unit

InactiveCN111324038AReasonable designImprove image qualityAdaptive controlImaging qualityBackpropagation neural nets
The invention discloses a hysteresis modeling and end-to-end compensation method based on a gating cycle unit. Nonlinearity, memory characteristics and frequency correlation of the hysteresis effect are fully considered, a double-layer structure hysteresis model including a gating cycle unit and a back propagation neural network is designed, and complex characteristics of the hysteresis effect areaccurately described. Aiming at the problem of atomic force microscope imaging distortion caused by a hysteresis effect, the hysteresis model established by the invention is utilized to calculate theactual position of a scanning point in the forward and reverse scanning processes, and a more real sample morphology image is obtained by designing an improved Hermite interpolation method. Experimental results show that the hysteresis model established by the method is high in precision and strong in generalization ability, nonlinearity, memory characteristics and frequency correlation of the hysteresis effect of the piezoelectric actuator can be accurately simulated, and image distortion caused by the hysteresis effect can be effectively eliminated by utilizing a compensation algorithm designed by the model, so that the imaging quality of the atomic force microscope is improved.
Owner:NANKAI UNIV
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