Array backboard, probe used for testing array backboard and liquid crystal display panel

The invention discloses an array backboard, a probe used for testing the array backplane and a liquid crystal display panel. In the array backboard, conductive units are used to pass through a covering layer of signal wires so as to electrically conduct each signal wire to the surface of the array backboard; and the output positions of different kinds of signals on the surface are horizontally or vertically staggered through staggered configuration of the conductive units. The probe provided with strip conductive blocks (conductive bars) is matched to perform the line detection of the array backboard. During detection, the probe is only arranged on the surface of the array backboard, and the output positions of the different kinds of signals on the surface contact different conductive bars respectively. Through the device, an extender line is unnecessarily designed additionally for testing, and the line test can be easily performed on the array backboard by using the probe. After the test, the signal wires and the extender line for testing are cut without extra manufacture procedure.