Method for testing performance of storage system

A storage system and testing method technology, applied in the field of storage system performance testing, can solve problems such as different application environments

Inactive Publication Date: 2012-11-21
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, since the SPC test is generally provided by the manufacturer itself, and the data is the performance limit

Method used

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  • Method for testing performance of storage system
  • Method for testing performance of storage system

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Embodiment Construction

[0027] The method of the present invention is described in detail below with reference to the accompanying drawings.

[0028] The performance test method of the storage system is to characterize the performance of the system conveniently and feasiblely. The performance test of the storage system is divided into four main parts: storage device, storage network, storage system software and application test performance.

[0029] Among them, the storage device performance test indicators in the storage performance test system include: IO operations per second, data transmission rate, IO response time, etc.

[0030] Storage network performance test indicators include: throughput, aggregate bandwidth, concurrency, and scalability.

[0031] Storage system software performance testing includes storage resource management, network and host mapping management, system backup and recovery management, system warning management, etc. in:

[0032] Storage resource management indicators inclu

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Abstract

The invention provides a method for testing the performance of a storage system, which comprises the following steps of: 1, testing the performance of storage equipment; 2, testing the performance of a storage network; 3, testing the software performance of the storage system; 4, testing the application performance; and 5, combining software and hardware to construct a test system. The method provided by the invention comprises test indexes of different parts of the system; all the test indexes have independent calculating methods and dimensions; and the system for testing the performance of the storage system is one unified whole body, not only comprises a longitudinal hierarchical relationship, but also comprises a parallel relationship among the indexes, wherein different indexes reflect different aspects of the storage system and respectively belong to different types, and thus, different storage systems not only can be subjected to test of one single index, but also can be subjected to combined test so as to feed back different performance aspects of the system.

Description

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Claims

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Application Information

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Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
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