Phase change memory unit and preparation method thereof

A phase change memory and phase change technology, applied in electrical components and other directions, can solve problems such as disconnection and device failure, and achieve the effects of simple preparation method and process, reduced heat demand, and good thermal isolation

Pending Publication Date: 2020-10-13
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, the loss of antimony near the anode will form mobile nano-voids, and finally gather at the interface with the anode,

Method used

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Experimental program
Comparison scheme
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Example Embodiment

[0049] The core idea of ​​the present invention is that the present invention provides a phase change memory cell and a preparation method thereof. A phase change memory cell of the present invention includes a bottom electrode, a phase change material stabilization layer, a phase change material layer and a top electrode that are sequentially connected; wherein the phase change material stabilization layer has conductivity, and the phase change material is electrically conductive at a certain temperature. The reaction between the stable layer of the change material and the layer of the phase change material at the interface can avoid the failure of the phase change unit caused by the separation of elements in the phase change material layer, and can be simpler and compatible with the existing standard CMOS The process compatible method prepares phase change memory cells with high reliability and high integration density.

[0050] The specific embodiments of the present invention wi

Example Embodiment

[0052] Example one

[0053] In the following specific embodiments of the present invention, please refer to Image 6 , Image 6 It is a schematic diagram of the structure of a phase change memory cell of the present invention. Such as Image 6 As shown, the phase change memory cell is provided on a substrate 101. The substrate 101 may include a semiconductor material, such as a silicon substrate, a gallium arsenide substrate, a germanium substrate, a silicon germanium substrate, or a fully depleted silicon-on-insulator (FDSOI) substrate. The substrate can also be an integrated circuit, including an integrated circuit with gate transistors such as transistors, diodes, and the like. The substrate may also be an interconnection layer, such as a copper interconnection layer, a graphene interconnection layer, and the like.

[0054] Please refer to Image 6 . In this embodiment, a first dielectric layer 102 is provided on the substrate 101, and a bottom electrode 103 is provided in the f

Example Embodiment

[0076] Example two

[0077] Please refer to Picture 12 . In this embodiment, a first dielectric layer 202 is provided on the substrate 201, and the bottom electrode 203 is provided in the first dielectric layer 202; and the lower surface of the bottom electrode 203 is connected to the upper surface of the substrate 201. The bottom electrode 203 is disposed on the lower layer of the phase change material stabilization layer 204, and the upper surface of the bottom electrode 203 is connected to the lower surface of the phase change material stabilization layer 204.

[0078] There are two phase change material layers 207, which are separately arranged on both sides of the phase change material stabilization layer 204. The inner sides of the two phase change material layers 207 are connected to the two sides of the phase change material stabilization layer 204, and the two phase change The upper surface of the material layer 207 is respectively connected to the lower surface of a top el

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PUM

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Abstract

The invention discloses a phase change memory unit which comprises a bottom electrode, a phase change material stabilizing layer, a phase change material layer and a top electrode which are connectedin sequence. The phase-change material stabilizing layer has electrical conductivity, and the phase-change material stabilizing layer and the phase-change material layer react at an interface at a certain temperature, so that failure of the phase-change unit caused by separation of elements in the phase-change material layer is avoided. Meanwhile, the phase-change material stabilizing layer divides the phase-change material layer into a left area and a right area, a 2R structure is formed, and the integration density of the phase-change unit can be improved. The invention further discloses a preparation method of the phase change memory unit, the process is simple and can be compatible with an existing standard CMOS process, and large-scale production is easy.

Description

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Claims

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Application Information

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Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT
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