Coplanar load pull test fixture for wave measurements

Active Publication Date: 2020-03-17
TSIRONIS CHRISTOS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However parasitic components and strong low pass behavior of the network reduce the higher harmonic components over-proportionally (FIG. 11); then reconstitution of the original signal form is affected negatively.
This is the typical problem in analog telephony and associated distortion of the higher tones (harmonics) in voice or music transmission.
However such a setup includes connectors, adapters and transmission lines between the DUT and the couplers and suffers from higher insertion loss and low pass behaviour and creates considerable signal deformation due to parasitic components of the connectors and the other fixture parts.
This causes the necessary reference plane corrections to become larger and thus possibly inaccurate.

Method used

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  • Coplanar load pull test fixture for wave measurements
  • Coplanar load pull test fixture for wave measurements
  • Coplanar load pull test fixture for wave measurements

Examples

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Example

[0030]Regular transistor test fixtures come in two basic forms: Micro-strip (MS) fixtures, FIG. 2 (see ref. 2) or Coplanar Waveguide (CPW) fixtures, FIG. 8 (see ref. 4). MS fixtures (see ref. 9) come in form of simple micro-strip, wherein there are one or more metallized strips 20 on the top surface and a continuous metallized ground plane 21 on the bottom side of the dielectric substrate 22. In the case of coplanar waveguide (CPW), FIG. 8, the ground plane 80 is on the same top surface as the signal conductor 81 (see ref. 4). Both those types of test fixtures can be enhanced by adding signal couplers 30, 82 inside the enclosure of the test fixture and close to the DUT (FIGS. 3 and 8); the directional signal sampling (FIG. 9) is created through capacitive (electric) or inductive (magnetic) coupling of a set of conductive wire bridges 86 or conductor sections 100 to the main signal transmission line 82, 101.

[0031]A typical micro-strip (MS) transistor test fixture (FIG. 2) comprises at l

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Abstract

Coplanar waveguide microwave transistor test fixtures include integrated wideband signal sensors/couplers and allow the detection of the main signal and its harmonic components, generated by a transistor in high power operation mode, by using a phase-calibrated network or signal analyzer and thus the reproduction of real time signal waveforms.

Description

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Claims

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Application Information

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Owner TSIRONIS CHRISTOS
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