Image processing device, image processing method, and image processing program

Process of First Embodiment

[0103]In order to suppress the detection position deviation of the iris illustrated in FIG. 7, the image processing device according to the embodiment includes the following

and

[0104]An edge image, which stores information regarding a gradient magnitude and a positive or negative sign of gradient, is generated by filtering a face image to detect an edge in a scanning direction. For example, in a case where an edge is extracted and the data D43 is generated in Step S43 illustrated in FIG. 4, a special edge image, which stores information regarding a gradient magnitude and a positive or negative sign of gradient, is generated.

[0105]A likelihood with respect to a sampling curve is calculated by setting points having a positive gradient as likelihood evaluation targets in a first point group which is positioned on a front side in the scanning direction among the plurality of points constituting the sampling curve, and setting points having a negative gradient...

Process of Second Embodiment

[0130]FIG. 12 illustrates an example of a pattern shape of a particle filter according to a second embodiment. FIGS. 13A and 13B are schematic diagrams illustrating specific examples of processing data in a case where the pattern shape of the particle filter illustrated in FIG. 12 is applied.

[0131]In the second embodiment, “sampling process” illustrated in FIGS. 13A and 13B is performed using a semicircular filter pattern FP illustrated in FIG. 12. That is, the same process as that of the first embodiment is performed except that the shape of the filter pattern changes. Since FIG. 13A is the same as FIG. 6 except that an edge image D73 is illustrated instead of the edge image D92, the detailed description thereof will not be repeated. Further, since FIG. 13B is the same as FIG. 7 except that an edge image D73 is illustrated instead of the edge image D53, the detailed description thereof will not be repeated.

[0132]The filter pattern FP illustrated in FIG. ...

Process of Third Embodiment

[0139]FIG. 15 illustrates an example of a pattern shape of a particle filter according to a third embodiment. FIGS. 16A and 16B are schematic diagrams illustrating specific examples of processing data in a case where the pattern shape of the particle filter illustrated in FIG. 15 is applied.

[0140]In the third embodiment, a “sampling process” illustrated in FIGS. 16A and 16B is performed using the semicircular filter pattern FP2 illustrated in FIG. 15. That is, the same process as that of the first embodiment is performed except that the shape of the filter pattern changes. Since FIG. 16A is the same as FIG. 6 except that an edge image D73 is illustrated instead of the edge image D92, the detailed description thereof will not be repeated. Further, FIG. 16B is the same as FIG. 7 except that an edge image D73 is illustrated instead of the edge image D53, the detailed description thereof will not be repeated.

[0141]The filter pattern FP2 illustrated in FIG. 15 ...