High-availability test method and system based on FPGA and DPDK

A test method and test system technology, applied in software testing/debugging, error detection/correction, inter-program communication, etc., can solve problems such as slow loading speed and affect the running efficiency of simulation test, and achieve the goal of improving running efficiency and usability. Effect

Pending Publication Date: 2022-02-08
江苏信而泰智能装备有限公司
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AI Technical Summary

Benefits of technology

The technology described by this patented allows for independent operation between different types of services on an integrated circuit (IC). This means that if one type of service needs upgradation or maintenance while another does work properly, it will continue running even after being tested again with new versions. It saves considerable effort because there are no re-startings needed before starting up any other version of the same product.

Problems solved by technology

This patented describes an improved method used during testing of electronic systems with multiple ports connected together. To make sure these connections have been properly tested before they fail or become unstable over time, there must be some way to quickly restore their functionality after failure without interrupting any other operations being performed at another location. Current methods require waiting until all simulations completed, leading to reduced system utilization rates due to delays caused by communication networks. Therefore, the goal of the present technology lies towards developing a faster and efficient solution where only one copy of each simulated device needs to wait while others perform its calculations simultaneously.

Method used

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  • High-availability test method and system based on FPGA and DPDK
  • High-availability test method and system based on FPGA and DPDK

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Embodiment Construction

[0060] High availability: that is, high availability;

[0061] Availability: Availability is the probability or time occupancy expectation that the system can operate normally at a certain inspection time. When the investigation time is a specified moment, it is called instantaneous availability; when the investigation time is a specified period, it is called period availability; when the investigation time is any moment during continuous use, it is called inherent availability. It is a measure of the actual performance of the equipment after it is put into use, and it is a comprehensive characteristic of the reliability, maintainability and maintenance support of the equipment or system.

[0062] The embodiment of the present application discloses a high-availability test system based on FPGA and DPDK, which includes a server, and the server includes multiple controllers, memory, hard disk and one or more boards. The controller may be a CPU in this embodiment, and may be a chip

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Abstract

The invention relates to the technical field of software testing, in particular to a high-availability testing method and system based on an FPGA and a DPDK, and the method comprises the steps: loading the FPGA through a preset FPGA service process; initializing the DPDK through a preset DPDK service process; enabling the FPGA service process to call a hardware traffic simulation command and carry out a hardware traffic simulation test based on the FPGA; enabling the FPGA service process to call a software protocol simulation command and perform a software protocol simulation test based on the DPDK; and after the software protocol simulation test is finished, enabling the DPDK service process to obtain an automatic restart instruction, and restarting the DPDK service process. The method and the device have the effects of improving the running efficiency of the simulation test and improving the usability of the software.

Description

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Claims

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Application Information

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Owner 江苏信而泰智能装备有限公司
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