Memory with Self-Test Function and Method for Testing the Same

a memory and self-testing technology, applied in the field of memory and a self-testing function and a test method, can solve the problems of consuming limited hardware resources, affecting imposing extra costs on memory manufacturers, so as to improve the efficiency of memory modification, reduce the time required for testing, and save costs

Active Publication Date: 2011-07-21
REALTEK SEMICON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patent describes a way to make sure that memories have their own tests. It suggests dividing them into smaller sections called partitions where each section contains different types of storage units like RAMs (Random Access Memory) and hard drives. These partitions are then divided into smaller groups called storage blocks. Each group holds one type of storage data and another type of storage signatures. When these storage blocks are modified by adding new ones, they only require modification from older versions instead of rebuilding the entire system. This saves both time and money compared to traditional methods.

Problems solved by technology

This patent describes a problem where memory devices require testing regularly due to their increasing size and complexity. However, current methods involve compressing large amounts of data into smaller chips, requiring significant hardware resources and time. Therefore, there is a desire to create a new memory device with a self-test function without sacrificing its functionality.

Method used

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  • Memory with Self-Test Function and Method for Testing the Same
  • Memory with Self-Test Function and Method for Testing the Same
  • Memory with Self-Test Function and Method for Testing the Same

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Embodiment Construction

[0013]The following detailed description is provided to described embodiments of the present invention. FIG. 1 shows a block diagram according to a preferred embodiment of the present invention. As shown in the figure, the memory with a self-test function according to the present invention comprises a testing unit 10, a memory unit 20, and a comparison module 30. The testing unit 10 is used for producing a pattern signal, and outputting the pattern signal to the memory unit 20. According to an embodiment, the testing unit 10 can be MBIST. If the memory is a ROM, the testing unit 10 can be ROM BIST. According to another embodiment, the testing unit 10 includes a control unit 100 and a signal-generating unit 102. The control unit 100 is used for producing a control signal, and transmitting the control signal to the signal-generating unit 102, which produces a pattern signal after receiving the control signal. According to an embodiment, the signal-generating unit 102 is a pattern generat

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Abstract

The present invention relates to a memory with a self-test function and a method for testing the same. The memory comprises a testing unit, a memory unit, and a comparison module. The method for testing the memory comprises steps of the testing unit producing a pattern signal; a first storage block of the memory unit storing storage data, and outputting the storage data according to the pattern signal; a second storage block of the memory storing a compare signature corresponding to the storage data; and the compare module producing a test signature according to the storage data output by the memory unit, and comparing the test signature to the compare signature and outputting a testing result for judging validity of the memory unit. Thereby, the memory unit according to the present invention is partitioned into two storage blocks for storing the storage data and the compare signature, respectively, and thus achieving the purposes of saving the testing time, costs, and hardware resources.

Description

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Claims

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Application Information

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Owner REALTEK SEMICON CORP
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