Method for controlling N-type 4H-SiC homogenous epitaxial doping

A technology of homoepitaxy and control methods, applied in the directions of diffusion/doping, chemical instruments and methods, from chemically reactive gases, etc., to achieve the effect of simplifying the preparation process, reducing defects, and improving device performance

Inactive Publication Date: 2013-12-04
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to propose an N-type 4H-SiC homoepitaxial doping control method to prepare epitaxial layers with different doping concentrations by c

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0025] Example 1

[0026] Step 1: Place the silicon carbide substrate in the reaction chamber of the silicon carbide CVD equipment.

[0027] (1.1) Selection bias A 4H silicon carbide substrate with a crystal orientation of 8° is placed in the reaction chamber of the silicon carbide CVD equipment;

[0028] (1.2) Vacuum the reaction chamber until the pressure in the reaction chamber is lower than 1×10 -7 mbar.

[0029] Step two, heating the reaction chamber in a hydrogen stream.

[0030] (2.1) Open the hydrogen switch leading to the reaction chamber and control the hydrogen flow to gradually increase to 80L / min;

[0031] (2.2) Turn on the vacuum pump to extract the gas in the reaction chamber and keep the pressure of the reaction chamber at 300mbar;

[0032] (2.3) Gradually increase the power of the heating source to slowly increase the temperature of the reaction chamber. When the temperature exceeds 1400°C, add C with a flow rate of 5 mL / min to the hydrogen stream. 3 H 8 .

[0033] Step

Example Embodiment

[0048] Example 2

[0049] Step 1. Select the bias The 4H silicon carbide substrate with crystal orientation 8° is placed in the reaction chamber of the silicon carbide CVD equipment; the reaction chamber is evacuated until the pressure in the reaction chamber is lower than 1×10 -7 mbar.

[0050] Step 2. Open the H leading to the reaction chamber 2 Switch to control the hydrogen flow to gradually increase to 80L / min, and at the same time turn on the vacuum pump to extract the gas in the reaction chamber, keep the pressure of the reaction chamber at 500mbar; gradually increase the power of the RF heating source, so that the temperature of the reaction chamber slowly rises, when the temperature of the reaction chamber After reaching 1400°C, add C at a flow rate of 7mL / min into the hydrogen stream 3 H 8 .

[0051] Step 3. After the temperature of the reaction chamber reaches 1580°C, keep the temperature of the reaction chamber constant, and keep the flow of H into the reaction chamber

Example Embodiment

[0055] Example 3

[0056] The first step is to select the bias The 4H silicon carbide substrate with crystal orientation 8° is placed in the reaction chamber of the silicon carbide CVD equipment; the reaction chamber is evacuated until the pressure in the reaction chamber is lower than 1×10 -7 mbar.

[0057] The second step is to open the H leading to the reaction chamber 2 Switch to control the hydrogen flow to gradually increase to 80L / min, and at the same time turn on the vacuum pump to extract the gas in the reaction chamber, keep the pressure of the reaction chamber at 700mbar; gradually increase the power of the RF heating source to slowly increase the temperature of the reaction chamber, when the temperature of the reaction chamber After reaching 1400°C, add C at a flow rate of 10mL / min into the hydrogen stream 3 H 8

[0058] In the third step, the substrate is etched in situ.

[0059] (3.1) When the temperature of the reaction chamber reaches 1600℃, keep the temperature of t

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Abstract

The invention discloses a method for controlling N-type 4H-SiC homogenous epitaxial doping. The method includes steps of placing silicon carbide substrates into a reaction chamber; heating the reaction chamber in hydrogen stream; adding C<3>H<8> into the hydrogen stream after the temperature of the reaction chamber reaches 1400 DEG C; performing in-situ etching on the substrates for 10-30 minutes after the temperature of the reaction chamber reaches 1580 DEG C; keeping the temperature of the reaction chamber at the temperature of 1580 DEG C, keeping the pressure of the reaction chamber within the range of 300mbar-700mbar, adding SiH<4> at a flow rate of 15-24mL/min, C<3>H<8> at a flow rate of 5-10mL/min and N<2> at a flow rate of 2L/min into the hydrogen stream at a rate of 80L/min and growing epitaxial layers; cooling the silicon carbide substrates in the hydrogen stream after the epitaxial layers complete growing; filling argon into the reaction chamber until the pressure of the reaction chamber reaches the normal pressure. The method has the advantages that only the pressure of the reaction chamber is changed, operation is simple and convenient, and the manufactured silicon carbide epitaxial layers are doped uniformly, have smooth surfaces and can be used for manufacturing silicon carbide devices.

Description

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Claims

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Application Information

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Owner XIDIAN UNIV
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