Measuring device and measuring method for measuring weak anisotropy in large-size isotropic transparent medium and application

A measuring device and transparent medium technology, applied in the direction of polarization influence characteristics, etc., can solve the problems of inability to test weak anisotropy of isotropic transparent medium, high cost, low precision, etc., and achieve short measurement time, high accuracy, The effect of improving detection accuracy

Active Publication Date: 2022-04-22
FUJIAN INST OF RES ON THE STRUCTURE OF MATTER CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented device measures optical materials by placing them between two light sources that generate specific wavelengths when excited at certain frequencies or angles. These measurements help identify defects on these material surfaces which could affect their performance negatively during manufacture or usage. They also provide reliable data related to its lifespan and effectiveness compared to existing methods like XRF techniques used earlier.

Problems solved by technology

Technologies described in this patents involve studying changes in dielectric constants near surfaces called quantum states when exposed to radiation from certain types of sources like infrared rays. Different techniques exist for detecting weakening properties within thin layers made up of atomic particles. Existing solutions require special equipment and complex processes, making it challenged to apply them across different environments without affecting any desired characteristics.

Method used

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  • Measuring device and measuring method for measuring weak anisotropy in large-size isotropic transparent medium and application
  • Measuring device and measuring method for measuring weak anisotropy in large-size isotropic transparent medium and application
  • Measuring device and measuring method for measuring weak anisotropy in large-size isotropic transparent medium and application

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Embodiment 1

[0091] In this embodiment, the above-mentioned measuring device is used to measure the weak anisotropy of the isotropic transparent medium 8, wherein the pump source 1 is a semiconductor laser with 808nm and a maximum power of 100W; Nd: YAG crystal, the size is φ5mm*100mm, and the front surface of the crystal is provided with coatings AR@808nm and AR@1064nm that are highly transparent to the output laser. The indicating light path 9 is a red visible light source with an output wavelength of 632.8nm (provided by a He-Ne laser); the transparent medium 8 is K9 glass with a size of 3mm*3mm*1mm.

[0092] In this embodiment, the weak anisotropy of the above-mentioned Nd:YAG crystal and K9 glass is actually measured, and the measurement method specifically includes the following steps:

[0093] (1) Resonant cavity 3, isotropic laser medium 4 are aligned with reference to indicating optical path 9, increase the power of the pump light, and fine-tune the angle of resonant cavity 3, the an

Embodiment 2

[0106] In this embodiment, the above-mentioned measuring device is used to measure the weak anisotropy of the isotropic transparent medium 8, wherein, the pump source 1 is a semiconductor laser with 793nm and a maximum power of 100W; the laser medium 4 is selected from Fujing company. Tm: YAG crystal, the size is φ4mm*100mm, and the front surface of the crystal is provided with coatings AR@793nm and AR@2013nm which are highly transparent to the output laser. The indicating light path 9 is a red visible light source with an output wavelength of 632.8nm (provided by a He-Ne laser); the transparent medium 8 is an alumina transparent ceramic with a size of 3mm*3mm*1mm.

[0107] In this embodiment, the weak anisotropy of the above-mentioned Tm:YAG crystal is actually measured, and the measurement method is the same as in Embodiment 2, wherein, after fine-tuning the angle of the resonator, the minimum power P1 of the output laser after polarization is 215mW, and the maximum power of the

Embodiment 3

[0112] In this embodiment, the above-mentioned measuring device is used to measure the weak anisotropy of the isotropic transparent medium 8, wherein the pump source 1 is a semiconductor laser with 808nm and a maximum power of 100W; Nd: YAG crystal, the size is φ5mm*100mm, and the front surface of the crystal is provided with coatings AR@808nm and AR@1064nm that are highly transparent to the output laser. The indicating light path 9 is a red visible light source with an output wavelength of 632.8nm (provided by a He-Ne laser); the transparent medium 8 is a polyethylene film with a size of 3mm*3mm*0.01mm.

[0113] In this embodiment, the weak anisotropy of the above-mentioned Nd:YAG crystal is actually measured, and the measurement method is the same as in Example 2, wherein the minimum power P1 of the output laser after polarization is 105mW, the maximum power of the output laser after polarization is 110mW, and the minimum power of the output laser is 105mW. The polarization rat

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Abstract

The invention discloses a weak anisotropy measuring device and a weak anisotropy measuring method for measuring a large-size isotropic transparent medium, and belongs to the technical field of material performance testing. The measuring device comprises a condensation cavity, a pumping source, a laser medium, a transparent medium, a resonant cavity, a polarization test module, a signal analysis module, a weak anisotropy calculation module and an indication light path, wherein the pumping source, the laser medium and the transparent medium are fixed in the condensation cavity; the laser medium and the pumping source are fixed in the light gathering cavity, and the laser medium is located at the focus of the light gathering cavity; and the light gathering cavity is arranged in the resonant cavity. The invention further provides a measuring method and application of the measuring device. The problem that weak anisotropy of the isotropic transparent medium is difficult to accurately measure in the prior art is solved, the mode of combining polarization detection and signal analysis is adopted, and the detection precision, speed and accuracy are greatly improved.

Description

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Claims

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Application Information

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Owner FUJIAN INST OF RES ON THE STRUCTURE OF MATTER CHINESE ACAD OF SCI
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