Polishing apparatus

Inactive Publication Date: 2007-05-31
EBARA CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0039] According to the present invention described above, heat due to friction between the subs

Problems solved by technology

This means that it is difficult to achieve both of these effects with a single dresser.
However, dummy polishing requires cleaning of the dummy wafers and, as a result, downtime of the apparatus would be increased.
In addition, a temperature of the polishing

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Example

[0051] Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a view showing a structural example of a polishing apparatus according to the present invention. In FIG. 1, a reference numeral 10 represents a polishing table. A polishing pad 11 is attached to an upper surface of the polishing table 10. The polishing table 10 is rotated by a non-illustrated rotating mechanism in a direction indicated by arrow A.

[0052] A reference numeral 12 represents a substrate holder (top ring). This substrate holder 12 comprises a circular substrate-holding member 13 for attracting and holding a substrate (e.g., a silicon wafer) W to be polished. The substrate-holding member 13 has an attraction surface configured to attract the substrate W thereto, and this attraction surface has a plurality of openings 13a communicating with a space chamber 14 formed in the substrate-holding member 13. The space chamber 14 is coupled to a vacuum source 15 via a

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PUM

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Abstract

A polishing apparatus is used to polish a workpiece such as a semiconductor wafer. The polishing apparatus includes a polishing table having a polishing surface, a dresser for dressing the polishing surface, a substrate holder for holding and pressing a substrate against the polishing surface to polish the substrate with relative movement between the polishing surface and the substrate. The dresser includes a first dressing member and a second dressing member. The first dressing member has a circular shape having a diameter larger than a diameter of the substrate. The second dressing member is shaped so as to surround the first dressing member. The first dressing member and the second dressing member are operable to come into contact with the polishing surface independently of each other.

Description

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Claims

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Application Information

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Owner EBARA CORP
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