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3 results about "Abnormality detection" patented technology

Abnormality detection method and device based on log graph modeling

The invention provides an abnormality detection method and device based on log graph modeling. The method and the device are applied to a nonsocial network. The method particularly includes: buildinga bipartite graph according to a key field of abnormal data annotated in advance in the nonsocial network, wherein left-side nodes of the bipartite graph correspond to multiple user accounts while right-side nodes of the same correspond to parameter combinations during business interface requesting; extracting features from the bipartite graph, and splicing the extracted features to form a featurevector; performing k-means cluster processing on the basis of the abnormal data and the feature vector to acquire optimal cluster number; according to the optimal cluster number, using a Gaussian mixing model to fit dark industry feature probability distribution; when receiving incoming data, calculating dark industry probability of the data according to feature vector of the incoming data and the Gaussian mixing model, and judging whether the data are abnormal or not according to the dark industry probability and the dark industry feature probability distribution. When the data are judged abnormal, access behaviors of users can be intervened timely, so that network attacks by hackers can be avoided.
Owner:BEIJING QIYI CENTURY SCI & TECH CO LTD

Temperature abnormality detection method and semiconductor manufacturing apparatus

A semiconductor manufacturing apparatus includes: a hot plate that heats an article to be processed; a temperature control section that controls temperature of the hot plate; a main body control section that controls the entirety of the apparatus based on a process recipe; and an elevating mechanism that elevates the article to be processed above the hot plate. The semiconductor manufacturing apparatus further includes: a storage section that stores temperature data of the hot plate; an elevation control section that controls the elevating mechanism and sends elevation timing data to the storage section; a management range calculation section that calculates a management range corresponding to parameter behavior in a transient gradient state based on the temperature data, process recipe data, and the elevation timing data; and an abnormality detection section that detects apparatus abnormality with the use of the management range calculated by the management range calculation section.
Owner:PANASONIC CORP
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