Appearance inspection apparatus of workpiece and appearance inspection method of workpiece

A technology for visual inspection devices and workpieces, which is applied to furnace components, metal processing, conveyor objects, etc., can solve problems such as decreased shooting accuracy, decreased electrostatic adsorption force, and electrostatic destruction characteristics of workpieces, and achieves improved shooting accuracy and improved processing capabilities. , Eliminate the effect of electrostatic destruction and/or characteristic deterioration

Active Publication Date: 2013-07-17
TOKYO WELD CO LTD
View PDF5 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it is not limited to when transferring the workpiece on the linear feeder to the conveying table, the workpiece is transferred upward in a certain direction, and the posture of the workpiece is fixed by electrostatic adsorption after transfer, so it is possible that each workpiece may be Minor differences in poses lead to a decrease in shooting accuracy
[0009] In addition, since the workpiece is charged while conveying the workpiece in the linear feeder, the workpiece may be attracted to the linear feeder by electrostatic adsorption during conveyance, resulting in a decrease in conveying speed, and in the worst case, the workpiece stops.
[0010] The second problem is that the el

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Example

[0053] The first embodiment

[0054] Hereinafter, embodiments of the present invention will be described with reference to the drawings. Figure 1 to Figure 9 It is a figure which shows the 1st Embodiment of the appearance inspection apparatus of a workpiece|work and the appearance inspection method of a workpiece|work which concerns on this invention.

[0055] First, pass figure 2 Let's explain the workpiece inspected by the workpiece visual inspection device.

[0056] in figure 2 Among them, the work W, which is a chip component such as a capacitor and / or a resistor, has a hexahedral shape, and has a main body Wd made of an insulator and electrodes Wa and Wb made of conductors formed on both ends of the main body Wd in the longitudinal direction. In the case of performing an appearance inspection of the workpiece W, the workpiece W is placed on a conveyor table 2 described later, and the conveyor table 2 is directed figure 2 Rotate in the direction of arrow Z to convey the workpi

Example

[0112] Second embodiment

[0113] Next, use Figure 10 to Figure 15 The second embodiment of the present invention will be described.

[0114] Figure 10 to Figure 15 The second embodiment of the present invention shown is different only in that a conductive plate (conductor) 15 is arranged below the conveying table 2 instead of disposing the charging unit 6A below the conveying table 2. The other structure is different from Figure 1 to Figure 9 The first embodiment shown is substantially the same.

[0115] in Figure 10 to Figure 15 In the second embodiment shown, the Figure 1 to Figure 9 The same parts in the first embodiment shown are denoted by the same symbols, and detailed descriptions are omitted.

[0116] here, Picture 10 Is viewed from the direction of arrow Y figure 1 A perspective view of the area S enclosed by the dashed line in Figure 4 Corresponding. in Picture 10 On the lower side of the middle conveying table 2, a conductive plate 15 made of a conductor and the lo

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an appearance inspection apparatus of workpieces and an appearance inspection method of workpieces, which can correctly position the workpieces on a conveyor table and do not generate electrostatic damage and/or characteristic degradation to the workpieces. The appearance inspection apparatus of workpieces has a straight line feeder which conveys hexagonal workpieces, a conveyor table which transfers and conveys the workpieces from the straight line feeder, a transfer column alignment unit which transfers the workpieces from the straight line feeder to the conveyer and aligns the workpieces into columns, a live unit which enable a lower surface of the conveyor table to be charged so as to maintain the workpieces, and a photographing unit which photographs six faces of each workpiece. The transfer alignment unit has a non-vibration part which is positioned between the straight line feeder and the conveyor, and a column alignment guiding body which aligns the workpieces into columns. The column alignment guiding body comprises a guiding surface which is a straight line when being overlooked. A vacuum pumping unit for pumping vacuum of gaps between the conveyor and the column alignment guiding body is arranged.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner TOKYO WELD CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products