Appearance inspection apparatus of workpiece and appearance inspection method of workpiece
A technology for visual inspection devices and workpieces, which is applied to furnace components, metal processing, conveyor objects, etc., can solve problems such as decreased shooting accuracy, decreased electrostatic adsorption force, and electrostatic destruction characteristics of workpieces, and achieves improved shooting accuracy and improved processing capabilities. , Eliminate the effect of electrostatic destruction and/or characteristic deterioration
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Example
[0053] The first embodiment
[0054] Hereinafter, embodiments of the present invention will be described with reference to the drawings. Figure 1 to Figure 9 It is a figure which shows the 1st Embodiment of the appearance inspection apparatus of a workpiece|work and the appearance inspection method of a workpiece|work which concerns on this invention.
[0055] First, pass figure 2 Let's explain the workpiece inspected by the workpiece visual inspection device.
[0056] in figure 2 Among them, the work W, which is a chip component such as a capacitor and / or a resistor, has a hexahedral shape, and has a main body Wd made of an insulator and electrodes Wa and Wb made of conductors formed on both ends of the main body Wd in the longitudinal direction. In the case of performing an appearance inspection of the workpiece W, the workpiece W is placed on a conveyor table 2 described later, and the conveyor table 2 is directed figure 2 Rotate in the direction of arrow Z to convey the workpi
Example
[0112] Second embodiment
[0113] Next, use Figure 10 to Figure 15 The second embodiment of the present invention will be described.
[0114] Figure 10 to Figure 15 The second embodiment of the present invention shown is different only in that a conductive plate (conductor) 15 is arranged below the conveying table 2 instead of disposing the charging unit 6A below the conveying table 2. The other structure is different from Figure 1 to Figure 9 The first embodiment shown is substantially the same.
[0115] in Figure 10 to Figure 15 In the second embodiment shown, the Figure 1 to Figure 9 The same parts in the first embodiment shown are denoted by the same symbols, and detailed descriptions are omitted.
[0116] here, Picture 10 Is viewed from the direction of arrow Y figure 1 A perspective view of the area S enclosed by the dashed line in Figure 4 Corresponding. in Picture 10 On the lower side of the middle conveying table 2, a conductive plate 15 made of a conductor and the lo
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap