Analyzer for detecting pollution of ion source
An ion source and analyzer technology, which is applied in the field of analyzers for detecting ion source pollution, can solve the problems of product quality impact, inability to constantly monitor various impurity ions and their sizes in the ion source, and achieve the effect of avoiding product pollution
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[0013] The present invention will be described in further detail below in conjunction with accompanying drawing:
[0014] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.
[0015] Secondly, the present invention is described in detail using schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of explanation, the cross-sectional view showing the device structure will not be partially enlarged according to the general scale, and the schematic diagram is only an example, and it should not be limited here. The protection scope of the
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