Analyzer for detecting pollution of ion source

An ion source and analyzer technology, which is applied in the field of analyzers for detecting ion source pollution, can solve the problems of product quality impact, inability to constantly monitor various impurity ions and their sizes in the ion source, and achieve the effect of avoiding product pollution

Active Publication Date: 2013-08-14
SEMICON MFG INT (SHANGHAI) CORP
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This technology uses two separate sheets made up of carbon (graphene) flakes that can move within certain dimensions when exposed to an electric field. When these materials come into contact with any harmful substances like bacteria or chemicals, it causes them to change their electrical properties due to changes caused by this interaction. By measuring how well these materials behave under various conditions during use, researchers may be able to identify potential sources for environmental hazards such as airborne particulate matter.

Problems solved by technology

This patented technical problem addressed in the current state of ion injection technologies relating to improving the performance and reliance of materials during manufacturing processes such as semiconductor fabrications. Current methods involve exposure to harmful particles like oxygen (O2) which can damage sensitive devices used within these layers. Additionally, existing techniques have limitations due to the size and shape of certain elements being injected into the process itself.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analyzer for detecting pollution of ion source
  • Analyzer for detecting pollution of ion source
  • Analyzer for detecting pollution of ion source

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] The present invention will be described in further detail below in conjunction with accompanying drawing:

[0014] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0015] Secondly, the present invention is described in detail using schematic diagrams. When describing the embodiments of the present invention in detail, for the convenience of explanation, the cross-sectional view showing the device structure will not be partially enlarged according to the general scale, and the schematic diagram is only an example, and it should not be limited here. The protection scope of the

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an analyzer for detecting pollution of an ion source, which comprises an ion screen pipe, and further comprises a controller, wherein a plurality of graphite strips which are isolated mutually and side-by-side are arranged on the side wall of the ion screen pipe; the controller is connected with the various graphite strips; monotypic impurity ions are received by the graphite strips; and the controller monitors the impurity ions on the graphite strips to be used for detecting the pollution of the ion source. According to the analyzer for detecting the pollution of the ion source, the graphite strips which are isolated mutually and side-by-side are arranged on the side wall of the ion screen pipe; as the ion moving radiuses of the impurity ions are different, the impurity ions fall down at the different positions on the side wall of the ion screen pipe of the analyzer, namely, different graphite strips can receive different impurity ions; and the controller is connected with the rear ends of the various graphite strips to detect electrical current of each graphite strip and detect whether the impurity ions are abnormal or not, so that whether the ion source causes pollution or whether the ion source is unstable is judged and massive product pollution is avoided.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner SEMICON MFG INT (SHANGHAI) CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products