Highly-ionized energy element sampling system of inductively coupled plasma emission spectrometer

A plasma and inductive coupling technology, which is applied in the direction of material analysis, instruments, and scientific instruments by optical means, can solve the problems of low detection sensitivity, achieve low detection sensitivity, increase the concentration of the element to be tested, and improve the effective injection. amount of effect

Pending Publication Date: 2020-03-06
LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Benefits of technology

This patented technology improves upon previous methods by making it easier to measure very small amounts of an organism's metabolites without being affected negatively from other substances that are also involved in its growth process. By doing this, researchers have found new ways to study how different types of biological molecules work together better than before they were grown on silicon substrate.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving the accuracy and precision of analyzing complex mixtures containing different compounds while minimizing damage from exposure during sampling processes or ensuring that no dangerous substances enter into sensitive areas like laboratories where they may affect health.

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  • Highly-ionized energy element sampling system of inductively coupled plasma emission spectrometer

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Embodiment Construction

[0013] Such as figure 1 As shown, the high ionization energy element sampling system of the inductively coupled plasma emission spectrometer includes the inductively coupled plasma emission spectrometer A, and the system also includes the ultrasonic atomization device IB-1, the ultrasonic atomization device IIB-2, and the solvent removal device C , hydrogenation reaction device D and gas-liquid separation device E; ultrasonic atomization device IB-1 and ultrasonic atomization device IIB-2 both include ultrasonic generators 1-a, 1-b and atomization chambers 2-a, 2-b, Among them, the ultrasonic generator 1-a, 1-b is connected with the spray chamber 2-a, 2-b, and the spray chamber 2-a, 2-b is guided by the spray chamber main body and the sample injection penetrating into the spray chamber main body. tube 3-a, 3-b; the desolvation device C includes a heating tube 4 and a condenser tube 5 connected from bottom to top through a glass ball grinding port; The chemical chamber 2-a is con

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Abstract

The invention discloses a highly-ionized energy element sampling system of an inductively coupled plasma emission spectrometer. The sampling system comprises the inductively coupled plasma emission spectrometer, an ultrasonic atomization device I and an ultrasonic atomization device II, a solvent removal device, a hydrogenation reaction device and a gas-liquid separation device; each of the ultrasonic atomization device I and the ultrasonic atomization device II comprises an ultrasonic generator and an atomization chamber, wherein the ultrasonic generator is connected with the corresponding atomization chamber; the atomization chamber is composed of an atomization chamber main body and a sampling guide tube penetrating into the atomization chamber main body; the ultrasonic atomization device I and the ultrasonic atomization device II are connected with the inductively coupled plasma emission spectrometer through a quartz glass tube via the hydrogenation reaction device and the gas-liquid separation device; and the ultrasonic atomization device II is connected with the inductively coupled plasma emission spectrometer through a quartz glass tube via the solvent removal device. By virtue of the sampling system, the problem of low detection sensitivity of the inductively coupled plasma emission spectrometer on a highly-ionized energy element (mainly a hydrogenation element and a non-metallic element) can be solved.

Description

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Claims

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Application Information

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Owner LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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