Data input buffer in semiconductor device

Inactive Publication Date: 2006-10-05
SK HYNIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0016] It is, therefore, an object of the present invention to provide a data input buffer in a semiconductor capable of a

Problems solved by technology

Accordingly, the static input buffer is not useful for a device requiring low swing or high operational frequency of the input signal.
In the worst case, the current driving capability is low and,

Method used

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  • Data input buffer in semiconductor device
  • Data input buffer in semiconductor device
  • Data input buffer in semiconductor device

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Embodiment Construction

[0023] In accordance with the present invention, current driving capability of a data input buffer is adjusted by using sensing result that is obtained with a temperature sensor and / or process characteristic sensor. For this purpose, the present invention applies an element for adjusting current amount flowing through a data input part and a reference voltage input part step by step, and an element for making a current control signal from the sensing result. With the present invention, even under worst-case process characteristic or high temperature condition, operation speed deterioration of the data input buffer can be avoided.

[0024] Hereinafter, a data input buffer in a semiconductor device in accordance with the present invention will be described in detail referring to the accompanying drawings.

[0025]FIG. 2 provides a circuit diagram of a data input buffer in accordance with one embodiment of the present invention.

[0026] Referring to FIG. 2, the data input buffer 100 of the e

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Abstract

A data input buffer in a semiconductor is capable of avoiding operation speed deterioration of the data input buffer due to the temperature condition or process characteristic. The data input buffer in a semiconductor device includes an input detecting unit for detecting logic level of input data by comparing the voltage level of the input data with a reference voltage, a current driving capability adjusting unit for adjusting current driving capability of the input detecting unit based on at least one of temperature condition and process characteristic, and a buffering unit for buffering the output signal from the input detecting unit.

Description

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Claims

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Application Information

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Owner SK HYNIX INC
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