Color measurement device, image forming apparatus, electronic equipment, color chart, and color measurement method

Active Publication Date: 2016-09-29
SEIKO EPSON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0154]Here, when the distance (the measurement distance) between the medium A and the spectrometer 17 varies according to the color measurement position due to the influence of structural causes of the printer 10, waviness of the medium A, or the like, the light quantity of the light which is reflected from the medium A and is incident on the spectrometer 17 fluctuates. Thus, when the reflectance, the chromaticity, or the like of the color patch 31 is calculated using reference values, which are obtained by spectrally measuring a reference object such as a white reference plate disposed in a position that differs from the actual color measurement position, there is a concern that an error between the appropriate reference values (ideal values) in the actual color measurement positions and the reference values which are used may exceed an allowable amount. In addition, there is a concern that it is not possible to acquire, with high precision, the color measurement results of the reflectance, the chromaticity, or the like.
[0155]To handle this, in the printer 10 of the present embodiment, the reference value of the color measurement position Sc is acquired based on the measured value corresponding to the first position W1 and the second position W2 which interpose the color measurement position Sc in the Y direction which is the predetermined direction. The color measurement result of the color patch 31 disposed at the color measurement position Sc is acquired based on the measured value and the reference value of the color measurement position Sc.
[0156]Accordingly, even if the measurement distance fluctuates along the predete

Problems solved by technology

Therefore, in a case in which the reflectance, the chromaticity, or the like of a measurement target is calculated using reference values (i.e., measured values that are a light quantity values of a measurement wavelength) that are obtained by spectrally measuring a reference object (e.g., a white reference plate) disposed in a position which differs from the actual color measurement position, there is a concern that differences will arise in the measurement distances between the measurement positions of the reference object and the actual measurement

Method used

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Example

Modification Example

[0212]Note that, the present disclosure is not limited to the embodiments described above, and configurations obtained by modification, improvement, combination, as appropriate, of the embodiments, and the like within a range in which it is possible to achieve an aspect of the present disclosure are included in the present disclosure.

[0213]In the embodiments described above, a case is described in which the color measurement is performed using a color chart including a plurality of color patches and including two white portions which interpose each of the color patches along the Y direction and are adjacent thereto; however, the present disclosure is not limited thereto. For example, an average value may be acquired according to measured values of other white portions, of which there is one or a plurality, besides the two white portions which are adjacent along the Y direction.

[0214]The color chart may include at least a color patch and two white portions (reference

Example

[0215]FIG. 14 is a diagram illustrating modification example 1 of a color chart.

[0216]In a color chart 3C illustrated in FIG. 14, the white rows Lw are disposed in the first row and the last row, and the color patch rows Lc are disposed in the other rows. The color patch rows Lc are formed of only the color patches 31.

[0217]Even if this color chart 3C is used, it is possible to suppress the influence of waviness of the medium A in the Y direction, and it is possible to obtain an improvement in the color measurement precision.

Example

[0218]FIG. 15 is a diagram illustrating modification example 2 of a color chart.

[0219]In a color chart 3D illustrated in FIG. 15, the white rows Lw are disposed in the first row, the last row, and at least one row between the first row and the last row, and the color patch rows Lc are disposed in the other rows. The color patch rows Lc are formed of only the color patches 31.

[0220]In a case in which the color measurement is carried out using the color chart 3D, for example, the reference value may be acquired using the white portion 32 which is closest to the color measurement target color patch 31 in the +Y direction, and the white portion 32 which is closest in the −Y direction, and the average value of the measured values of a plurality of the white portions 32 may be used as the reference value.

[0221]It is possible to obtain an improvement in the color measurement precision in the same manner as a case in which the color chart 3C is used, even if the color chart 3D is used.

[0222]Wi

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PUM

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Abstract

A printer moves a color chart relative to a spectrometer that carries out spectral measurement on the color chart. The color chart, which is a color measurement target of the printer, includes a color patch and a white portion that is positioned in a first position and a second position. The first position and the second position interpose a color measurement position, in which the color patch is disposed, along a predetermined direction. The printer acquires measured values by carrying out spectral measurement for the color measurement position, the first position, and the second position, determines a reference value corresponding to the color measurement position based on the measured values of the first position and the second position, and determines a color measurement result of the color patch based on the measured value of the color measurement position and the reference value.

Description

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Claims

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Application Information

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Owner SEIKO EPSON CORP
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