Contact parameter detection circuit

A parameter detection and circuit technology, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve problems such as unreasonable design, imperfect structure, and inability to collect accurate data products, etc., to achieve the effect of improving quality and improving production efficiency

Inactive Publication Date: 2017-10-20
乐清市三江自动化设备有限公司
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This technology helps improve the accuracy and reliance on sensing when changing contacts during manufacturing processes or products. It uses a special device called a touch parameter detector that moves along one line perpendicularly while measuring how well it'll be doing before being affected negatively (change). By comparing these measurements against previous results from similar devices, any issues can be identified early enough without affecting final product quality.

Problems solved by technology

The technical problem addressed by this patented technology relates to improving accuracy during detecting changes made on contactors used within an electronic device's control system (ES). This can lead to incorrect reporting or poor treatment decisions that may negatively impact both sales performance and customer satisfaction levels.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Contact parameter detection circuit
  • Contact parameter detection circuit
  • Contact parameter detection circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] see Figure 1-7 , a contact parameter detection circuit, comprising a line displacement sensor circuit 1, a signal pulse circuit 9, a detection sampling circuit 11, a coil pull-in relay drive circuit 12, a clock oscillation circuit 13 and a motor drive circuit 14, the line displacement sensor circuit 1 contains the input port 2 of the linear displacement sensor, the integrated chip 3, the first exclusive OR gate chip 4, the second exclusive OR gate chip 5,

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a contact parameter detection circuit, and the circuit comprises a linear displacement sensor circuit, a signal pulse circuit, a detection sampling circuit, a coil suction relay drive circuit, a clock oscillation circuit and a motor drive circuit. The linear displacement sensor circuit comprises a linear displacement sensor input port and an integrated chip. The signal pulse circuit comprises a processing chip, and the detection sampling circuit comprises a light-emitting diode D1. The circuit controls the reverse movement of a sensor through the linear displacement sensor circuit, and detects whether the state of each contact changes or not, thereby effectively solving a problem of product quality caused by a condition that accurate data cannot be collected in the prior art under the condition that a contact changes, greatly improving the quality of a product, and improving the production efficiency.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner 乐清市三江自动化设备有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap