On-batch pressing testing device for touch control chip

A technology of touch chip and testing device, which is applied in the direction of measuring device, using stable tension/pressure testing material strength, instruments, etc., to achieve the effect of ensuring test accuracy, test safety and accuracy

Inactive Publication Date: 2018-08-03
HUZHOU HUINENG ELECTROMECHANICAL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology allows for testing electronic devices such as smart cards without physically damaging them. It uses an apparatus called a lottery card machine (MCG) where multiple small pieces are pressed onto it like fingers when they hit something. These tiny buttons help keep things stable while being measured accurately. They also have sensors attached to their surfaces that measure how well these buttons work against what's going wrong. By monitoring this data overtime, researchers may use simulation techniques to improve understanding about why certain components behave differently compared to those who did experimentally. Overall, MCG offers technical benefits for studying electronics more efficiently and safely.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving the accuracy and reliability during manufacturing processes where multiple types of contact sensors (such as those made up from different materials) must undergo resistance tests before being assembled into products like smartphones. Current methods involve individually measuring these properties after assembly, which makes them difficult to maintain overtime without losing precision.

Method used

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  • On-batch pressing testing device for touch control chip
  • On-batch pressing testing device for touch control chip
  • On-batch pressing testing device for touch control chip

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Embodiment Construction

[0020] The embodiments involved in the present invention will be described in further detail below in conjunction with the accompanying drawings.

[0021] to combine Figure 1 ~ Figure 4 , a batch press test device for touch chips, including a device body, the device body includes a base 1, the base 1 is divided into a positioning layer 2, an adsorption layer 3 and a control layer 4, and the positioning layer 2, the adsorption layer 3 and the control layer 4 are composed of Arranged in order from top to bottom, the positioning layer 2 is provided with a number of positioning grooves 5, the depth of the positioning grooves 5 is equivalent to the thickness of the chip to be tested, and the bottom of the adsorption layer 3 is provided with a number of vacuum pumps 6, the number and position of the vacuum pumps 6 are consistent with the positioning Corresponding to the groove 5, the vacuum tube 7 of the vacuum pump 6 runs through the top of the adsorption layer 3 and communicates wit

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Abstract

The invention provides an on-batch pressing testing device for touch control chips. The on-batch pressing testing device comprises a device body, wherein the device body comprises a base; the base isdivided into a positioning layer, a sucking layer and a control layer; the positioning layer, the sucking layer and the control layer are sequentially arranged from top to bottom; a plurality of positioning grooves are formed inside the positioning layer. According to the on-batch pressing testing device, touch control chips to be tested are solidly sucked into the positioning grooves, a piston isdriven by a cylinder to press down imitated fingers to the part above the chips to be tested, pressing action of human fingers is imitated, in the testing process, the force exerted to the surfaces of the chips to be tested from the fingers is kept unchanged when the driving parameters of the cylinder are changed, meanwhile, the situation that the chips to be tested are damaged because of too large pressing forces can be avoided, the on-batch pressing testing device is simple in debugging and good in consistency, the testing efficiency can be improved, great convenience can be brought to on-batch testing, and convenience can be brought to large-scale production and maintenance.

Description

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Claims

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Application Information

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Owner HUZHOU HUINENG ELECTROMECHANICAL TECH CO LTD
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