Electron spin emission based terahertz spectrometer and spectral analysis system

An electron spin, terahertz technology, applied in the field of spectral testing, can solve the problems of difficult implementation, high cost, high cost, etc., and achieve the effect of reducing heat dissipation design requirements, increasing weight and cost, and reducing design difficulty

Active Publication Date: 2020-01-07
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology allows for efficient use of photonics devices (PCD). It includes various technical features like high damage thresholds, wide bandwidth emission from nanocrystals, low duty cycle efficiency, long lifetime, stable performance over different environments, reduced size, lower costs compared to current methods or techniques, etc., resulting in better signal quality and greater sensitivity towards small samples.

Problems solved by technology

Technological Problem addressed in this patents relates to improving the efficiency and accuracy of small electronic devices like smartphones or tablets for measuring physical properties (such as their size) while maintaining precise control over various aspects including temporal resolution and dynamic ranges. Current methods require expensive components and bulky equipment making them impracticable for applications where they were previously designed.

Method used

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  • Electron spin emission based terahertz spectrometer and spectral analysis system
  • Electron spin emission based terahertz spectrometer and spectral analysis system
  • Electron spin emission based terahertz spectrometer and spectral analysis system

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Embodiment 1

[0037] This embodiment discloses a terahertz time-domain spectral analysis system based on electron spin emission of terahertz waves, including a terahertz spectrometer and a computer.

[0038] The terahertz spectrometer is mainly composed of a fiber femtosecond laser, a mirror, a transmitter, a sample holder, a receiver, a data acquisition and processing module, a computer, an optical delay line and an optical fiber. Wherein, the fiber femtosecond laser includes a spatial light output port and an optical fiber output port, and the outgoing beam of the spatial light output port is incident on the transmitting end through a reflector; the outgoing light beam of the optical fiber output port is incident on the receiving end through an optical delay line. end; the sample rack is located between the transmitting end and the receiving end, and the sample rack is used to place the object to be measured; the receiving end is connected with the data acquisition and processing module.

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Abstract

The invention discloses an electron spin emission based terahertz spectrometer and spectral analysis system. The terahertz spectrometer comprises a fiber femtosecond laser which enables femtosecond light at a spatial light output port to enter a transmitting end; coherent detection light of the fiber output port is input to a receiving end through an optical delay line; a sample holder is positioned between the transmitting end and the receiving end; the transmitting end is used for generating terahertz pulses based on the electron spin effect of a hetero-structure under the combined effect offemtosecond laser excitation and an internal magnetic field; and the receiving end is used for forming a current under the effect of the sample terahertz pulse electric field, measuring the intensityof a specific terahertz pulse waveform point location based on the magnitude of the current, and outputting the intensity to a data acquisition and processing module so as to perform spectral analysis. Thus, the key performance indexes of the bandwidth and dynamic range of the terahertz time domain spectrometer can be effectively improved, the reliability of the whole spectrometer is improved, and the research difficulty and cost are effectively reduced.

Description

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Claims

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Application Information

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Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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