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131results about "Material analysis by optical means" patented technology

In-situ optical crack measurement using a dot pattern

InactiveUS20110106459A1Force measurementWork measurementObject basedElement model
A method of detecting cracks in an object includes: capturing a first image of a pattern of marks in a region of interest on a surface of the object; constructing a finite element model of the region of interest having nodes corresponding to the marks in the pattern; subjecting the object to a first mechanical load to produce strains in the object; capturing a second image of the pattern; computing strains in the object based on relative changes in locations of the marks in the first and second images; modifying the finite element model to produce a crack versus surface strain map; capturing a third image of the pattern; and comparing the locations of marks in the third image to the crack versus surface strain map to identify a crack in the object. An apparatus that performs the method is also provided.
Owner:NORTHROP GRUMMAN SYST CORP

Material decomposition image noise reduction

InactiveUS20080135789A1X-ray/infra-red processesRadiation/particle handlingData acquisitionImage noise reduction
A diagnostic imaging system in an example comprises a high frequency electromagnetic energy source, a detector, a data acquisition system (DAS), and a computer. The high frequency electromagnetic energy source emits a beam of high frequency electromagnetic energy toward an object to be imaged. The detector receives high frequency electromagnetic energy emitted by the high frequency electromagnetic energy source. The DAS is operably connected to the detector. The computer is operably connected to the DAS and programmed to employ a threshold to trigger a filter operation on a pixel, in a basis material decomposition (BMD) image of a plurality of BMD images, through comparison of an actual noise ratio between a pair of BMD images, of the plurality of BMD images, to a theoretical BMD noise ratio value. The computer operably connected to the DAS is programmed to employ a correlation in noise distribution of the plurality of BMD images to reduce image noise in the plurality of BMD images. The computer operably connected to the DAS is programmed to realize an adaptive algorithm through employment of an exponential correction function of a difference between the actual noise ratio and the theoretical BMD noise ratio value. The computer operably connected to the DAS is programmed to employ the adaptive algorithm to reduce the image noise in the plurality of BMD images.
Owner:GENERAL ELECTRIC CO

Sub-micron scale glass subsurface defect detection device and method

ActiveCN105842257AGuaranteed Quantitative MeasurementsGuaranteed stabilityMaterial analysis by optical meansMicron scaleGrating
The invention discloses a sub-micron scale glass subsurface defect detection device and method. A light source part of the device comprises a super-continuum luminous spectrum light source and a single-mode optical fiber circulator; a reference arm and sample arm part comprises a first collimating lens, a 45-degree cylindrical reflecting mirror, a reference objective, a reference reflecting mirror, a two-dimensional scanning galvanometer, a sample objective and a part to be detected; a detection arm part comprises a second collimating lens, a transmission grating, a focusing lens, a photoelectric detector and a computer. The method comprises the steps that light of a reference arm and light of a sample arm return back to the single-mode optical fiber circulator in the same way, light beams of the two arms encounter, and interference is caused; interfered light beams are subjected to light splitting through the transmission grating and then focused on different pixel elements of the photoelectric detector through the focusing lens, the photoelectric detector inputs collected signals into the computer, the signals are processed, and faultage images of different positions are obtained. According to the sub-micron scale glass subsurface defect detection device and method, the ultra-wide band light source, the high-power aperture imaging objectives and the common light path imaging structure are adopted, and the three-dimensional structure of sub-micron scale glass subsurface cracks is obtained.
Owner:NANJING UNIV OF SCI & TECH

Stacking glass bottle detection method based on machine vision and transporter

The invention discloses a stacking glass bottle detection method based on machine vision and a transporter based on the method. The detection method comprises the following steps: firstly, obtaining a bottle mouth image sent into a bottle collecting zone via a conveyor belt; then, performing image processing on the obtained bottle mouth graph so as to indentify whether the glass bottle in the current bottle collecting zone has abnormal situation or not; and if yes, giving an alarm. The transporter comprises a glass bottle conveyor belt, a travelling crane provided with a gasbag-type grappling fixture lifting gear and a fastening frame, a camera and a stand column rack, wherein the bottle collecting zone is directly below the fastening frame and is connected with the conveyor belt; a longitudinal guide rail and a horizontal guide rail which can move along the longitudinal guide rail are arranged in the bottle collecting zone; the camera used for collecting glass bottle images in the bottle collecting zone is arranged on the horizontal guide rail; and the lens of the camera is downwards vertical to the bottle collecting zone and is connected with a computer for processing images. The invention is easy to apply, has high degree of automation, high efficiency and wide industrial application prospect.
Owner:HUNAN UNIV

Method for non-intrusively identifying a contained material utilizing uncollided nuclear transmission measurements

An improved nuclear diagnostic method identifies a contained target material by measuring on-axis, mono-energetic uncollided particle radiation transmitted through a target material for two penetrating radiation beam energies, and applying specially developed algorithms to estimate a ratio of macroscopic neutron cross-sections for the uncollided particle radiation at the two energies, where the penetrating radiation is a neutron beam, or a ratio of linear attenuation coefficients for the uncollided particle radiation at the two energies, where the penetrating radiation is a gamma-ray beam. Alternatively, the measurements are used to derive a minimization formula based on the macroscopic neutron cross-sections for the uncollided particle radiation at the two neutron beam energies, or the linear attenuation coefficients for the uncollided particle radiation at the two gamma-ray beam energies. A candidate target material database, including known macroscopic neutron cross-sections or linear attenuation coefficients for target materials at the selected neutron or gamma-ray beam energies, is used to approximate the estimated ratio or to solve the minimization formula, such that the identity of the contained target material is discovered.
Owner:THE UNITED STATES AS REPRESENTED BY THE DEPARTMENT OF ENERGY

Methods and apparatus for controlling ion current in an ion transmission device

InactiveUS20050194543A1High sensitivityThermometer detailsBeam/ray focussing/reflecting arrangementsIon currentMass spectrometric
The invention provides apparatus and methods for controlling ion current in an ion transmission device. An apparatus of the present invention comprises an ion source, an ion transmission device, and a controller. The ion source and the ion transmission device are in ion communication therebetween, and the controller is in signal communication with both the ion source and the ion transmission device. The ion current of the ion transmission device may be controlled by coordinating at least one of the operating parameter values of the ion source with at least one of the operating parameter values of the ion transmission device. Such coordination may result in, for example, improved ion current in the ion transmission device. Also embraced by the present invention are mass spectrometer embodiments that include or use the apparatus or methods of the present invention for controlling ion current.
Owner:HIEKE ANDREAS DR

Solid-state imaging device, drive method thereof and camera system

ActiveUS20110267522A1SpeedReduced settling timeTelevision system detailsTelevision system scanning detailsPhotoelectric conversionSlew rate
A solid-state imaging device includes: pixel signal reading lines; a pixel unit in which pixels including photoelectric conversion elements are arranged; and a pixel signal reading unit performing reading of pixel signals from the pixel unit through the pixel signal reading lines, wherein the pixel signal reading unit includes current source circuits each of which includes a load element as a current source connected to the pixel signal reading line forming a source follower, and the current source circuit includes a circuit generating electric current according to a slew rate of the pixel signal reading line and replicating electric current corresponding to the above electric current to flow in the current source.
Owner:SONY CORP

Sensor System And Method For Characterizing A Coated Body

A method of characterizing a coated body by at least one coating parameter based on fitting to a physical model is provided. The coated body includes a substrate coated by a polymeric coating such as a paint film, the polymeric coating having at least one layer. The method is carried out by a sensor system in a non-contact manner, the sensor system including an emitter system for emitting THz radiation, a detector system for detecting THz radiation, and a processing unit operationally coupled to the emitter system and the detector system. The method includes: emitting, by the emitter system, a THz radiation signal towards the coated body such that the THz radiation interacts with the polymeric coating; and detecting, by the detector system, a response signal being the detected THz radiation signal having interacted with the polymeric coating.
Owner:ABB (SCHWEIZ) AG

Periodic defect detecting device and method for the same

InactiveCN102007400AMaterial analysis by optical meansMaterial magnetic variablesVIT signalsEngineering
A periodic defect detecting device comprises a sensor (4), small area selecting means (72, 74), an evaluation index calculating means (76), set value varying means (73, 75), and a period determination means (77). The small area selecting means (76) determines positions of small areas, the area lengths of which are smaller than that of an area, so that distance intervals between adjacent small areas are all equal, in the direction of arrangement of periodic defects, and selects signals corresponding to the positions of the plurality of small areas from the sensor output. The evaluation index calculating means (76) calculates the evaluation index of the mutual similarity of the signal patterns between the plurality of signals selected by the small area selecting means. The set value varying means (73, 75) vary the positions and distance intervals of the small areas to repeat the operation processing of the small area selecting means and the evaluation index calculating means. The period determination means (77) determines the distance intervals as periods when the evaluation index is higher than a preset value. A periodic defect detecting method comprises a signal input step, a small area selecting step, an evaluation index calculating step, a set value varying step, and a period determination step.
Owner:JFE STEEL CORP

Mobile phone appearance inspection system

The invention relates to the technical field of workpiece appearance inspection, in particular to a mobile phone appearance inspection system which comprises a conveying system and an appearance datacollecting device. The conveying system comprises a conveying device and a carrier. The carrier is placed on the conveying device for carrying a product to be inspected. The conveying device comprisesan upstream conveying unit, a middle conveying unit and a downstream conveying unit. The middle conveying unit comprises an upper conveying device and a lower conveying device, and the upstream conveying unit and the downstream conveying unit can move up or down to the height of the upper conveying device and the lower conveying device. The appearance data collecting device comprises a surface inspection module, a line scanning module, a corner inspection module, a side inspection module and an arc surface inspection module. The line scanning module, the angle inspection module, the arc surface inspection module and the side inspection module are distributed around the surface inspection module, and the angle inspection module is located between the line scanning module and the side inspection module. The mobile phone appearance inspection system can improve the inspection efficiency and is beneficial to industrial production.
Owner:WATRIX TECH CORP LTD +1

High-precision detection method for SBS (styrene butadiene styrene) contents in SBS modified asphalt

The invention discloses a high-precision detection method for SBS (styrene butadiene styrene) contents in SBS modified asphalt. The high-precision detection method includes the steps: preparing various SBS modified asphalt with the known SBS contents; respectively testing an infrared spectrum based on Fourier transformation for the SBS modified asphalt, calculating a specific value A of a characteristic absorption peak area A1 of an SBS modifying agent in the SBS modified asphalt and the sum of the characteristic absorption peak area A1 of the SBS modifying agent and a characteristic absorption peak area A2 of base asphalt, and building a standard curve equation of A values of the SBS modified asphalt corresponding to the SBS contents; testing the SBS modified asphalt to be detected by the aid of the infrared spectrum based on Fourier transformation, calculating corresponding A values, and substituting the corresponding A values into the standard curve equation to obtain the SBS contents in the SBS modified asphalt to be tested. The high-precision detection method has the advantages that the detection method is simple, the influence of the thickness of a modifying asphalt test sample on a test result is eliminated by the aid of the specific value of the characteristic absorption peak areas, section between characteristic absorption peak areas of an original creation infrared spectrum is selected, and the SBS contents in the SBS modified asphalt are rapidly and precisely detected.
Owner:SUZHOU UNIV OF SCI & TECH +1
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