Optical waveguide monitoring

Inactive Publication Date: 2005-04-12
OMNIGUIDE
View PDF15 Cites 58 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology helps evaluate how well optical fibers are designed with specific properties such as bending loss or transmission quality. By analyzing changes caused by external factors like pressure on these materials during manufacture, it can help identify any issues affecting their performance.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving the performance of opioidic communication systems due to their ability to transmit data wirelessly without interference from external sources like laser lights. Current methods involve adding extra materials near the ends of the glass cores within the waveguide, but these measures only reduce transmission loss when there're no external influences.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical waveguide monitoring
  • Optical waveguide monitoring
  • Optical waveguide monitoring

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

The invention features methods for detecting defects in and monitoring the transmission loss of an optical waveguide, during, for example, drawing or cabling of an optical waveguide. For example, the invention relates to monitoring the quality (e.g., monitoring transmission loss and detecting structural and compositional defects) of optical waveguides that utilize photonic bandgap confinement mechanisms for guiding light (referred to here as photonic crystal fibers), including hollow fibers. In general, defects refer to any structural, compositional or other perturbation of the fiber from its ideal design, which can affect the optical and / or mechanical performance and reliability of the fiber. Examples of defects include perturbations to core radius, perturbations to the layer thickness, delamination between layers, bubbles, particle inclusions in the core or layers, and compositional variations in the layers affecting the refractive index of the layers.

Fiber monitoring is performed

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Techniques for monitoring the quality (e.g., optical and mechanical properties) in optical waveguides (e.g., photonic crystal fibers) are disclosed. Additionally, techniques for detecting and localizing defects in the waveguides are also described. Pulses of light are launched into one end of an optical waveguide. The amount of light scattered out of the same end of the waveguide (i.e., a backscattered or reflected signal) is monitored at certain wavelengths specific to the spectral characteristics of the waveguide. Transmission characteristics and defect localization can be determined from the backscattered signal.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner OMNIGUIDE
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products