9 results about "Functional testing" patented technology

A method, system and computer program product is disclosed for providing test coverage for detecting failures in a software application. The method comprises the steps of identifying a set of test cases; and for each of at least a subset of said test cases, identifying one or more of the other test cases that depend on said each of the test cases based on a defined functional relationship. The method comprises the further steps of using a selected one of said subset of test cases to test the software application; and when said test of the software application fails, then testing the software application with the one or more of the other test cases that depend on said selected one of the test cases based on said functional relationship.

The invention provides an object-oriented based automatic testing method. The object-oriented based automatic testing method includes creating a testing script for testing network protocol installed in devices to be tested, and introducing the testing script into a data packet used for providing a testing script interface; selecting one device to be tested so as to select the network protocol configured in this device to be tested as a test object, wherein the network protocol comprises a plurality of configuration attribute parameters; setting by means of prestored attribute parameters and acquiring the network protocol having had the attribute parameters as the testing object; calling a plurality of functional testing points of the network protocol using the preset testing way as the testing object; appointing default command line configuration file route for the network protocol as the testing object. The object-oriented based automatic testing method is applicable to different devices and good in expandability, and work of automatic testing of developers is simplified.

A method of testing a semiconductor apparatus performs a function test of reading data from memory cells in SRAM by applying a potential lower than a GND potential to a backgate of an n-type MOS transistor with a drain connected with a storage node and a source connected with the GND potential. Then, the method performs a function test of reading data from memory cells by applying a potential higher than the GND potential to the backgate.

The invention relates to a logic resource test technique of programmable device, which can utilize the logic resource most and design it as tested circuit based on the character of device and the direction of signal, to test the circuit, and realize logic resource function test and direct-current and alternative-current parameter test. The invention has the advantages that: it provides a logic resource model and test technique based on measurable design technique; it uses one0time program/erase to complete the whole test of logic resource. And the inventive function test covering rate, the direct-current and alternative-current parameter test covering rates all reach 100%.

The invention provides a method for generating a functional test case of an electrical cabinet of a railway vehicle. The method comprises the following steps: generating a material list table of devices in the electrical cabinet, a driving logic table of a coil of a device to be tested and a driving logic table of a contact to be tested according to an imported wiring table; generating port pointlocation data and indexes based on the bill of materials table, the driving logic table of the to-be-tested device coil and the driving logic table of the to-be-tested contact; and generating a test sequence table according to the port point location data and the index, the test sequence table including result criterion information. According to the invention, the combination of automatic compiling and subsequent automatic testing of the test cases is realized, and the test is ensured to be quick, efficient and accurate. A traditional case writing mode is replaced, a one-by-one carding and one-by-one verification mode is replaced, and the tedious intermediate process is omitted. According to a specified product form and a verification rule, a logic loop needing to be tested is automatically identified and screened by taking the existing wiring list as an input, and a test case is automatically synthesized.

The invention relates to a method for testing a wireless communication module, and relates to the field of testing. The test method of the wireless communication module comprises the following steps: defect manifestation processing: under a first vibration condition, carrying out multiple times of rapid heating-cooling circulation processing on a module to be tested, the highest temperature Th of the rapid heating-cooling circulation being higher than the upper limit value of an operation limit temperature and lower than the upper limit value of a damage limit temperature, and the highest temperature Th being lower than the upper limit value of a damage limit temperature; the lowest temperature T1 of the rapid heating-cooling circulation is lower than the lower limit value of the operation limit temperature and higher than the lower limit value of the damage limit temperature; and functional testing: performing functional testing on the to-be-tested module subjected to defect manifestation treatment under a second vibration condition and a testing temperature. The method and the device are used for solving the problem that the test time of an existing reliability test is relatively long.

The application discloses a test device for testing the operating state of an electronic device. The test device comprises a base, a transmission mechanism disposed on the base, at least one carryingmechanism connected to the transmission mechanism, and a pressing mechanism arranged on the carrying mechanism. The carrying mechanism is used for carrying an electronic device; and the transmission mechanism is used for driving the carrying mechanism to move relative to the base. The pressing mechanism is used for pressing keys on the electronic device to control the operating state of the electronic device. Therefore, the e test efficiency can be greatly improved; automation of the key function test is realized; the key function testing can be quickly realized; and the accuracy is higher.