The invention discloses a two-port microstrip device testing device which comprises an X-axis displacement platform, a radio frequency connector carrying platform A, a radio frequency connector carrying platform B, a Z-axis displacement platform A, a Z-axis displacement platform B, an X-axis displacement platform, a bearing plate carrying platform A, a bearing plate carrying platform B, a bearing plate, ball spring screws and a to-be-tested piece carrying platform. Wherein the radio frequency connector platform deck A and the radio frequency connector platform deck B can move on the X-axis displacement platform along the X direction; ball spring screws are arranged in cavities of the bearing plate carrying table A and the bearing plate carrying table B and are positioned below the bearing plate; and the to-be-tested piece carrying table is positioned on the bearing plate between the radio frequency connector carrying table A and the radio frequency connector carrying table B. According to the invention, the device test can be rapidly and efficiently completed, and the connection of the microstrip line is completed by using a crimping method without welding and nondestructive test; moreover, the antenna is suitable for various microstrip line devices, and can be used in different lengths, different widths and different medium thicknesses.