Etching solution for dislocation display of monocrystal germanium wafer deflecting to crystal orientation [111] and etching method

A germanium single wafer and display technology, applied in the field of semiconductor single crystal material preparation, can solve the problems of severe corrosion reaction, corrosion of dislocation pits, off-angle of single wafer, etc., and achieve moderate corrosion rate, moderate reaction rate, and reaction The process is gentle and controllable

Inactive Publication Date: 2015-08-26
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This technology allows for efficient removal or destruction of defects caused by stress during manufacturing processes such as crystal growth. It also helps prevent damage from environmental factors like moisture and oxygen which may affect its performance overtime.

Problems solved by technology

This patented technical problem addressed in this patents relates to improving the efficiency and quality of chemicals needed during production processes involving silicon (Si), gallium (Ga)-based compounds like Ge, and various electronic device technologies including quantum dots and nanocrystals.

Method used

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  • Etching solution for dislocation display of monocrystal germanium wafer deflecting to crystal orientation [111] and etching method
  • Etching solution for dislocation display of monocrystal germanium wafer deflecting to crystal orientation [111] and etching method
  • Etching solution for dislocation display of monocrystal germanium wafer deflecting to crystal orientation [111] and etching method

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Embodiment 1100

[0041] Embodiment 1 The preparation of [100] partial [111] germanium single wafer dislocation display with etching solution

[0042] The germanium single crystal dislocation etching solution is prepared from analytically pure chemical reagents and powder chemical reagents, plus deionized water. The operation is carried out on a laboratory bench with a fume hood, and an electronic balance is used to weigh analytically pure anhydrous Cu. (NO 3 ) 2 Powder 10g, measure 130ml analytical pure 40% concentration HF aqueous solution and 20ml analytical pure 65% concentration HNO with measuring cylinder 3 aqueous solution. The measured HF aqueous solution and HNO 3 Pour the aqueous solution into a polytetrafluoroethylene beaker with a volume of 1L, add deionized water to the mark of 0.5L, and stir evenly with a glass rod.

Embodiment 2

[0043] Embodiment 2 The etching method carried out by using the etching solution prepared in Embodiment 1

[0044] Place the polytetrafluoroethylene beaker filled with the corrosive solution prepared in Example 1 in a constant temperature water bath, set the temperature of the constant temperature water bath to 30°C, and keep the corrosive solution within the temperature range of 30±1°C.

[0045] Take a rectangular single wafer with a length of 4 cm and a width of 3 cm cut from a germanium single wafer of 4 inches [100] biased to [111] 9°, clamp it into a beaker with tweezers, and soak the germanium wafer in deionized water , and then use tweezers to insert the germanium sheet into the polytetrafluoroethylene flower basket carrier, and immerse the polytetrafluoroethylene flower basket inserted with the germanium sheet into a polytetrafluoroethylene beaker filled with 40% concentration and analytically pure HF aqueous solution. The germanium single wafer is decontaminated on the s

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Abstract

The invention discloses an etching solution suitable for dislocation display of a crystal orientation [100] monocrystal germanium wafer deflecting to the crystal orientation [111] as well as an etching method. The method comprises steps as follows: preparing the etching solution; placing the prepared etching solution in a thermostat water bath for heating; cleaning the surface of the monocrystal germanium wafer; soaking the monocrystal germanium wafer in the etching solution for etching for 5 min; performing leaching and blow-drying on the etched monocrystal germanium wafer; observing the morphology after etching under a metallographic microscope finally. With the adoption of the etching method, a dislocation pit can be effectively etched out, the etching rate is moderate, the reaction process is mild and controllable, the etching method is simple and feasible when used for detecting the dislocation density of the crystal orientation [100] monocrystal germanium wafer deflecting to the crystal orientation [111], and the appearing probability of interference patterns such as water ripples and the like is low.

Description

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Claims

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Application Information

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Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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