32 results about "Microscope" patented technology

In accordance with preferred embodiments of the present invention, a method for imaging tissue, for example, includes the steps of mounting the tissue on a computer controlled stage of a microscope, determining volumetric imaging parameters, directing at least two photons into a region of interest, scanning the region of interest across a portion of the tissue, imaging a plurality of layers of the tissue in a plurality of volumes of the tissue in the region of interest, sectioning the portion of the tissue and imaging a second plurality of layers of the tissue in a second plurality of volumes of the tissue in the region of interest, detecting a fluorescence image of the tissue due to said excitation light; and processing three-dimensional data that is collected to create a three-dimensional image of the region of interest.

Systems and techniques for an optical scanning microscope and/or other appropriate imaging system includes components for scanning and collecting focused images of a tissue sample and/or other object disposed on a slide. The focusing system described herein provides for determining best focus for each snapshot as a snapshot is captured, which may be referred to as “on-the-fly focusing.” The devices and techniques provided herein lead to significant reductions in the time required for forming a digital image of an area in a pathology slide and provide for the creation of high quality digital images of a specimen at high throughput.

The invention discloses a microscopic section rapid digital scanning device and method with the real-time focusing function. The microscopic section rapid digital scanning device comprises a digital microscopic imaging system and a real-time focusing device combined with the digital microscopic imaging system in a matched mode. The digital microscopic imaging system comprises a computer, an image detecting device for achieving photovoltaic conversion, a microscopic optical imaging system, an automatic carrying table, a movement and control system corresponding to the automatic carrying table, a microscope lighting optical system, a lighting light source and the like. The real-time focusing device comprises a device for measuring the defocusing amount of a sample and a device for driving the sample or a lens to move and enabling the sample and the focal plane of the lens to be coincided. According to the microscopic section rapid digital scanning device and method, the distance between the sample and the focal plane of the imaging system in the section scanning process can be detected in real time, real-time focusing can be achieved, and therefore an excellent image is obtained; the time-consumed focal plane modeling process can be omitted through the real-time focusing technology; meanwhile, the large focusing range and the high focusing accuracy are both considered; in addition, the microscopic section rapid digital scanning method is high in efficiency and low in cost.

A device for detecting insects on substrates such as lettuce and other leaves. The device has a microscope lens which magnifies a portion of the leaf and send an image of the leaf portion to an image recognition system. If the image recognition system detects the presence of an insect—further steps are taken to remove the insect.

The invention is an optical fiber Prague grating sensor, characterized in that it is made by the steps of: (1) making optical fiber Prague grating; (2) making D-type section of the optical fiber Prague grating; (3) selecting rectangular ceramic substrate wider than 2cm, making two semicircular grooves at the two ends of the ceramic substrate, respectively, to fix two end points of photosensitive single-mode optical fiber in the ceramic substrate, then making an optical fiber groove to store the D-type optical fiber Prague grating in the center of the ceramic substrate by laser machining technique, where the diameter of the optical fiber groove is somewhat greater than that of the optical fiber; (4) installing the D-type optical fiber Prague grating; and (5) placing the ready-made D-type optical fiber Prague grating in the optical fiber groove and making the Prague grating located in the center of the ceramic substrate and simultaneously under the monitoring of high power microscope, assuring a plane of the D-type optical fiber Prague grating and the top end surface of the ceramic substrate are basically on the same horizontal.

The present invention discloses a method for analyzing a liquid cell sample, comprising the steps of: a) providing at least one liquid cell sample in a sample vial; b) obtaining data linked to the cells in the sample by performing differential digital holographic microscopy on said liquid cell sample in said sample vial. In a second aspect, the invention also provides for a system for analyzing a liquid cell sample, comprising (i) a differential digital holographic microscope comprising illumination means, a differential interferometer and a digital recording device connected to a processing device such as a computer; (ii) at least one exchangeable sample vial comprising a liquid cell (iii) a movable sample vial holder; characterized in that (iv) said sample vial holder is adapted to receive said sample vial; (v) said sample vial holder is adapted to position said sample vial such that the focal plane of the objective lens of said differential digital holographic microscope lies in the vial.

The invention discloses a network-based intelligent imaging analyzer for living cell culture in a box. The network-based intelligent imaging analyzer is directly arranged in the cell culture box when used, and the intelligent degree is high. The network-based intelligent imaging analyzer comprises a worktable, a support arranged on one side of the worktable, and a microscopic imaging device composed of a microscopic light source mechanism, an L-shaped microscopic optical mechanism and a photoelectric imaging part which are arranged on one side of the top of the worktable. Images captured through the device are digitally converted and transmitted to a cloud, and the device is connected with a computer or a mobile phone through the network. The network-based intelligent imaging analyzer further comprises a carrying table used for carrying culture dishes, a carrier precision rotating table mechanism, a transverse moving mechanism and a longitudinal moving mechanism. The microscopic light source mechanism is arranged at the top end of the support and is located over the carrying table. The network-based intelligent imaging analyzer has the advantages that non-contact observational study on cell culture can be achieved, the culture dishes do not need to be taken out and placed under a microscope to be observed, and the real-time changing conditions of cell culture in the culture box can be clearly observed on the computer or the mobile phone.

Multi-modal tumor imaging of neuroblastoma is essential for tumor staging, response evaluation and detection of relapsed diseased. The present invention provides a norepinephine analogue with a near-infrared (near-IR) dye, W765-BG, that efficiently and stably detects neuroblastoma in vivo using near-IR optical imaging. Confocal microscopy and optical imaging of neuroblastoma xenografts shows cell specific uptake and reveals exceptional tumor retention with a high tumor-to-tissue ratio up to 7 days after injection of W765-BG.

A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal an imprint of the removed bottom surface of the structure in a top surface of the substrate. The imprint can then be imaged using an atomic force microscope (AFM). The image can be used to measure the bottom surface of the structure.

The invention provides a method for detecting hard coating quality. The method includes: firstly machining a ball pit on the hard coating of a matrix according to a ball-milling technique, making the matrix exposed in the ball pit and letting the hard coating form an annular coating surface in the ball pit; then using a Vickers hardometer to extrude a conical indentation with a long bottom edge, a short bottom edge and two adjacent radial bottom edges on the annular coating surface, with a plane formed by the midpoint of the conical indentation's long bottom edge, the midpoint of the short bottom edge and the vertex of the conical indentation passing through the center of a ball corresponding to the ball pit, then employing a metallographic microscope to measure the radius a of a large circle corresponding to the upper part of the annular coating, the radius b of a small circle corresponding to the lower part of the annular coating, the distance L between two endpoints of the conical indentation's long bottom edge and the distance l between two endpoints of the conical indentation's short bottom edge, and then calculating the thickness T of the hard coating and the Vickers hardness by corresponding formulas. The method provided by the invention can measure thickness and test hardness combinedly at the same time, thus simplifying the measurement procedure and improving the efficiency of detection.

The invention discloses a preparation method of a micrometer-scale dispensing tungsten needle. The preparation method comprises the following steps: (1) winding a micrometer-scale tungsten wire onto an enameled wire; (2) penetrating the enameled wire with the tungsten wire through a capillary glass tube; (3) withdrawing the enameled wire, retaining the tungsten wire in the capillary glass tube, and straightening the tungsten wire; (4) heating the middle part of the capillary glass tube, applying a pulling force to one end of the capillary glass tube or applying opposite pulling forces to two ends of the capillary glass tube when a to-be-heated part stays at a molten state, so that the caliber of the heated part is gradually narrowed until the heated part is disconnected, completely exposing the tungsten wire on the part, and enabling the molten glass to be adhered onto the tungsten wire; (5) cutting off the exposed tungsten wire on the middle part, and forming two dispensing tungsten needles; (6) trimming needle points of the dispensing tungsten needles under a microscope, so that the length of the tungsten wire stretching out of the capillary glass tube is 0.2mm to 0.5mm. By adopting the preparation method, the micrometer-scale dispensing tungsten needle can be conveniently and rapidly prepared.

The invention discloses a mobile phone camera connector which can be generally used for intelligent mobile phones of any brand. The mobile phone camera connector comprises a mobile phone clip and a connection lens cone, wherein the connection lens cone is rotatably arranged on the mobile phone clip via a rotation arm, a shooting hole position is arranged at one end of the connection lens cone and abutted with a mobile phone camera, the other end of the connection lens cone is configured with a sleeve which can be abutted with an eye lens of an optical device, and a locking mechanism is configured between the mobile phone clip and the rotation arm and can be used for positioning the rotation position of the rotation arm. When the mobile phone camera connector is used, a mobile phone is clamped and fixed by the mobile phone clip, the connection lens cone rotates to a position corresponding to the mobile phone camera and is fixed by the rotation arm, the sleeve is finally sleeved on the eye lens of a telescope, a microscope and the like, and an image in the telescope, the microscope and the like can be acquired by the mobile phone camera. The mobile phone camera connector is very convenient to carry and use, is also low in manufacturing cost, and has relatively high practicability.

Disclosed is a method for manufacturing a semiconductor device, wherein, in a step (S1), a plurality of SiC semiconductor chips are mounted on a mounting substrate, and in a step (S2), a voltage is applied to the SiC semiconductor chips on the mounting substrate. In a step (S3), in the state wherein the voltage is applied, a temperature distribution image of the mounting substrate surface is obtained using thermography and thermal image devices, such as an infrared microscope, and in a step (S5), whether there is a failure chip or not is determined by analyzing the image. In a step (S7), in the case (S5:YES) wherein the failure chip is contained in the mounting substrate, the failure chip is rejected by cutting the wiring of the failure chip. Consequently, the method for manufacturing a semiconductor chip using small-capacity chips is provided.

The invention discloses an etching solution suitable for dislocation display of a crystal orientation [100] monocrystal germanium wafer deflecting to the crystal orientation [111] as well as an etching method. The method comprises steps as follows: preparing the etching solution; placing the prepared etching solution in a thermostat water bath for heating; cleaning the surface of the monocrystal germanium wafer; soaking the monocrystal germanium wafer in the etching solution for etching for 5 min; performing leaching and blow-drying on the etched monocrystal germanium wafer; observing the morphology after etching under a metallographic microscope finally. With the adoption of the etching method, a dislocation pit can be effectively etched out, the etching rate is moderate, the reaction process is mild and controllable, the etching method is simple and feasible when used for detecting the dislocation density of the crystal orientation [100] monocrystal germanium wafer deflecting to the crystal orientation [111], and the appearing probability of interference patterns such as water ripples and the like is low.

An optical arrangement having an optical assembly (1) for generating an intermediate image (2) in a beam path is configured and further developed such that an optical element (3) having a plurality of optical waveguides (4) is arranged in the beam bath after the intermediate image (2) to enable the imaging of the intermediate image (2) in a plane on a zone-by-zone or point-by-point basis. Further, a microscope exhibiting such an optical arrangement is specified.

The present invention discloses a USBC cable testing circuit, comprising a plurality of positive voltage modules for a USBC connector open test positive voltage, a plurality of negative voltage modules for testing a negative voltage and a plurality of short circuit test modules for testing a USBC connector short circuit test. 24 pins of a USBC cable form 22 pin pairs with two adjacent pins as a pair. Two pin pairs of front and back of the USBC form a pin pair group, the positive voltage module is used to test a pin pair that is connected to a low impedance, and the negative voltage module is used to test a pin pair that is connected to a high impedance. The test circuit has following advantages: time saving, wherein measurement of 24 pin positions of the USB-C is completed in a few seconds, and measurement for the prior art needs 10 minutes; trouble saving, wherein a test fixture can finish measuring the USB-C terminal while the prior art requires many devices such as a multimeter anda microscope. The testing circuit has high accuracy, has the small USBC connector, and a close distance between each pins. Only with the method, accurate testing can be achieved.

The invention discloses a core heat setting process method comprising the steps: step one, placing a capacitor core in a first baking box, performing vacuum pumping in the first baking box and keepingthe vacuum pressure in the box at 4-7 mbar. According to the core heat setting process method, the capacitor core is placed in the first baking box and 4-7 mbar vacuum pumping treatment is performed.The core cutting layer is examined by the microscope, the number of hollows on the cross section is 3-7/mm and the size of the hollow point is phi0.1-0.6 mm. Compared with the conventional heat setting process that the number of the hollows on the cross section is 15-23/mm and the size of the hollow point is 0.8-1 mm, the effect is obtained and then pretreatment at the temperature of 88-91 DEG Cis performed and the heat is preserved for 3-5 h and then the capacitor core is transferred to a second baking box and the second baking box is filled with nitrogen to raise the temperature by 121-128DEG C and the heat is kept for 3.5-5h. The core cutting layer is detected by the microscope and the thickness of the strengthened layer is 1-8 microns so that the effect is obvious in comparison withthe conventional direct heat setting that the detected thickness of the cross section oxide layer is 20-34 microns.

The invention discloses a no-wash sleep mask having layered structure, which comprises an aqueous phase component and an oil phase component. The aqueous phase component comprises water and a moisturizing agent; The oil phase ingredient comprises an emollient and a higher alcohol. A Maltese cross structure can be observe under a polarize microscope by that no-wash sleep mask of the invention, As that layered structure is similar to the phospholipid bimolecular layer structure of the cell membrane of human skin cell, it can provide a refreshing and non-greasy skin feeling, so the sleep mask ofthe invention is easy to absorb on the face, is not greasy, does not rub mud, and can be used as a no-wash sleep mask. The invention also discloses a preparation method of a no-wash sleep mask with alayered structure, which has the advantages of simple preparation process, no need of long-time emulsification, energy saving and low production cost.

The invention discloses a method for observing morphology and functions of lysosomes by using transgenic macrophage expressing GFP or mutants thereof. The method includes steps of separating and cultivating transgenic macrophage suspension expressing GFP or mutants thereof; observing the separated and cultivated macrophage under laser scanning confocal microscopes. The invention further discloses application of the expression GFP or the transgenic macrophage suspension to observing the morphology and the functions of the lysosomes by the aid of the laser scanning confocal microscopes. The method and the application have the advantages that the lysosomes can be observed by using transgenic macrophage expressing GFP or mutants thereof, and accordingly the locations of the lysosomes can be clearly displayed without staining; the ultrastructure morphology, and the quantities and dynamic change of the lysosomes for expressing GFP or the transgenic macrophage of the mutants thereof can be clearly and visually observed by the aid of the laser scanning confocal microscopes; the quantities and the locations of primary lysosomes which are yet to start to realize digestion effects, corresponding substrates in the primary lysosomes and secondary lysosomes which realize digestion effects at the moment or completely realize the digestion effects further can be visually displayed if the substrates are labeled by red fluorescent probes.

The invention provides a zinc oxide nano material resistance measurement method and device. A zinc oxide nano material is widely used in manufacturing of electric equipment such as nano power generators, gas sensors and memory storage devices. In the prior art, when the resistance of the zinc oxide nano material needs to be measured, micro-electrical manufacturing and specially designed equipment are needed, and it is inevitable that experiment cost is increased. The zinc oxide nano material resistance measurement device comprises a conductive substrate connected with a first wire, the first wire is connected with a power source, the power source is connected with an ampere meter through a second wire, the ampere meter is connected with an atomic force microscope probe through a third wire, the atomic force microscope probe makes contact with the zinc oxide nano material which is connected with the conductive substrate, and accordingly a closed loop is formed.

The invention belongs to the technical field of scanning electron microscopes, particularly relates to a cryoelectron microscope sample transfer system and method and electronic equipment, and aims to solve the problem that a cryoelectron microscope sample changes in the transfer process. The system comprises a master control center, a transfer table base, a transfer device, a transmission rod, a moving device, a rotating device and a vacuum docking mechanism. The moving device comprises a first power device, a first transmission assembly, a transmission lead screw, a transfer rod sliding rail, a moving sliding block and a limiting sliding block. The rotating device comprises a second power device and a second transmission assembly; a moving assembly composed of a moving sliding block, a limiting sliding block and a transmission rod moves to the transmission rod to be in butt joint with the transfer device, and the limiting sliding block and a second transmission assembly are locked; a rotating assembly composed of a transmission rod, a limiting sliding block and a second transmission assembly rotates to the transmission rod and is locked with the transfer device; the transfer device and the moving assembly move to the vacuum docking mechanism; the structure and the property of the sample are effectively prevented from being changed in the transfer process.

The invention discloses a microscope base milling fixture and relates to the technical field of machining. The microscope base milling fixture comprises a base. The microscope base milling fixture comprises a base. The base is provided with a locating tapered block and mounting bottom plates connected with the two ends of the locating tapered block respectively. The locating tapered block is provided with a locating surface, and an included angle gamma is formed between the locating surface and the bottom surface of the locating tapered block. Two V-shaped supporting blocks are symmetrically arranged on the locating surface. The V-shaped openings of the two V-shaped supporting blocks face the high side of the locating tapered block and incline towards the two ends of the locating tapered block. The angular bisectors of the included angles of the V-shaped working faces of the two V-shaped supporting blocks intersect to form an included angle theta. A pressing plate extending to the V-shaped opening of each V-shaped supporting block is arranged on the V-shaped supporting block through a bolt. Compared with the prior art, by adopting the microscope base milling fixture, a first microscope base and a second microscope base can be clamped and machined at the same time, clamping is easy, and the production efficiency is high.

The invention discloses a monitoring method of an environmental magnetic shield of an electronic scanning microscope, and the monitoring method comprises the following steps that a line drawing of a silicon wafer to be measured is selected; a plurality of measuring points are selected on one side of the line drawing, measuring data of the measuring points are collected, and measuring data of relative points of the measuring points are collected on the other side of the line drawing; first difference values among the measuring data of corresponding points on the two sides of the line drawing are calculated; the maximum difference value and the minimum difference value among the first difference values are obtained, and a second difference value between the maximum difference value and the minimum difference value is calculated and is used as a measuring result; the measuring result is recorded in an environmental magnetic shield influence control chart; and according to the measuring result recorded in the environmental magnetic shield influence control chart every time, a dynamic monitoring chart of the influence of the environmental magnetic shield is obtained. The invention provides the method for monitoring the environmental magnetic shield of the electronic scanning microscope by utilizing the line width and the line width roughness of the measured drawing.

The invention provides a method for cultivating cruciferae plants for observing the plasmodiophoromycetes infection. Root organizations of the initially-pathogenetic cruciferae plants are taken to prepare a plasmodiophoromycetes solution, cruciferae seeds are sowed in quartz sand, and the quartz sand and the seeds are soaked with an MS basic culture solution; under the conditions that the illumination intensity is 100 micro-mol photons/(m<2>.s), the illumination time ranges from 16 h to 18 h, the temperature ranges from 20 DEG C to 22 DEG C, and the humidity is higher than 75%, the seeds are cultivated until seed germination and are grown into plants with two main leaves. The plasmodiophoromycetes solution is applied to the roots of the plants to conduct the infection, and then root systems of the infected plants are observed through a biological microscope in a grading mode until the infection stage is finished. The method is easy and convenient to operate, distinct in observation result, small in occupied space and low in test cost, and has the advantages of being safe in operation, simple, high in repeatability, convenient to observe and distinct in result.