Semiconductor device for electrostatic discharge protection

a semiconductor and electrostatic discharge technology, applied in the direction of transistors, diodes, electric devices, etc., can solve the problems of damage to the ic, many conventional esd clamps suffer from being too slow to trigger, so as to speed up the triggering of scr, and accelerate the triggering

Active Publication Date: 2015-04-02
SOFICS BVBA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patent describes a way to improve the performance of an electronic component called an ESD (Electrostatic Discharge) protection circuit. It suggests adding a small amount of carriers during the process of triggering the ESCR, which helps it work faster.

Problems solved by technology

The technical problem addressed in this patent is how to improve the response times of traditional ESD clamps while reducing their impact on the IC's ability to protect against ESD events.

Method used

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  • Semiconductor device for electrostatic discharge protection
  • Semiconductor device for electrostatic discharge protection
  • Semiconductor device for electrostatic discharge protection

Examples

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Embodiment Construction

[0056]The circuits described herein comprise wells of a conductivity type, wherein the conductivity type may be either N-type or P-type. In the following embodiments, a circuit may be implemented with conductivity types as depicted in the accompanying figure. Alternatively, the embodiments may be implemented such that each conductivity type is the opposite of that shown in the figures and described in the accompanying text. For instance, wherein a PNP bipolar transistor is described comprising a first region of P conductivity type, a second region of N conductivity type, and a third region of P conductivity type, the conductivities of the regions may be flipped such that an NPN bipolar transistor may be alternatively implemented comprising the first region of N conductivity type, the second region of P conductivity type, and the third region of N conductivity type.

[0057]In the following descriptions, common numerical designations may be used for similar, corresponding parts across mult

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Abstract

Disclosed is an electrostatic discharge (ESD) protection circuit. The ESD protection circuit may include a silicon controller rectifier (SCR) which may be triggered via at least one of its first trigger gate or second trigger gate. The ESD protection circuit may further include a highly doped region coupled to either the anode or cathode of the SCR, wherein the highly doped region may provide additional carriers to facilitate triggering of the SCR during an ESD event, whereby the SCR may be triggered more quickly.

Description

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Claims

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Application Information

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Owner SOFICS BVBA
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