7 results about "Analyser" patented technology

System, method, and non-transitory medium for identifying a certain transaction likely to be impacted by a certain configuration change. An activity analyzer receives activity data of users belonging to different organizations and identifies, based on the activity data, a first set of code elements associated with transactions. A program analyzer receives the certain configuration change, and program data that describes at least one of the following: procedure invocations, user interface statements, and database access statements. The program analyzer identifies a second set of code elements that are influenced by the certain configuration change. An intersection module calculates an intersection between the first set of code elements and the second set of code elements. A transaction identifier identifies the certain transaction likely to be impacted by the certain configuration change based on a common code element belonging to the intersection.

The invention provides a device for automatically testing the calling service of a terminal. The device comprises an input engine, a communication module, a regulator and an analyzer, wherein the input engine is used for receiving an operation command of a user, resolving the configuration parameters of the users, constructing a test example according to the configuration parameters and building a calling flow process; the communication module is used for realizing communication driving of a whole system, classifying message values of the input engine and a tested system into an input value and a feedback value and respectively transmitting the input value and the feedback value to the regulator and the analyzer; the regulator is used for receiving the input value transmitted by the communication module and automatically regulating a prediction state set by taking the input value as a state trigger condition; and the analyzer is used for analyzing and comparing the prediction state set with an actual state set and outputting an analysis result. The invention also provides a method for automatically testing the calling service of the terminal. Compared with the prior art, dynamic regulation on the prediction state set is realized, automatic analysis on a test result is realized, and manual intervention is not completely required, so the test cost is saved, and the test efficiency is improved.

There is described a pulse analyser (1) for sampling a pulse or a repetitive stream of pulses. The pulse analyser multiplies a pulse by a set of basis functions (c1, c2) to generate a plurality of multiplied pulse functions, and a synthesiser (9a, 9b, 13) combines the multiplied pulse functions to generate a pulse sample. In particular, the synthesiser performs at least one integrating operation over an integration interval substantially corresponding to the duration of the pulse and at least one adding operation. The basis functions are such that the output of the synthesiser corresponds to a pulse sample for a sample time interval shorter than the integration interval.

The invention provides an ion implantation device. The device comprises a shielding room, an ion source, an extraction electrode, an analyzer, an analysis diaphragm, a focusing lens, an accelerating tube, a symmetric electrostatic scanning electrode and a uniform magnetic field parallel lens which are successively arranged. A first chamber and a second chamber which are isolated from each other are arranged in the shielding room. A high-voltage bin is arranged in the first chamber. A target chamber is arranged in the second chamber. The ion source, the extraction electrode, the analyzer and the analysis diaphragm are arranged in the high-voltage bin. The accelerating tube is arranged in the first chamber. A first outlet for an ion beam to enter the accelerating tube is formed in the high-voltage bin. The first chamber is provided with a second outlet for the ion beam to enter the symmetric electrostatic scanning electrode. The symmetric electrostatic scanning electrode and the uniformmagnetic field parallel lens are arranged in the second chamber. A target table, an orientation table, a wafer library and at least one manipulator for transferring wafers are arranged in the target chamber. The target chamber is provided with an injection port for the ion beam to be injected into the wafers on the target table. The device provided by the invention has the advantages of simple structure, low cost, convenience for realizing high-energy high-precision injection and the like.

The invention relates to an analyzer for detecting pollution of an ion source, which comprises an ion screen pipe, and further comprises a controller, wherein a plurality of graphite strips which are isolated mutually and side-by-side are arranged on the side wall of the ion screen pipe; the controller is connected with the various graphite strips; monotypic impurity ions are received by the graphite strips; and the controller monitors the impurity ions on the graphite strips to be used for detecting the pollution of the ion source. According to the analyzer for detecting the pollution of the ion source, the graphite strips which are isolated mutually and side-by-side are arranged on the side wall of the ion screen pipe; as the ion moving radiuses of the impurity ions are different, the impurity ions fall down at the different positions on the side wall of the ion screen pipe of the analyzer, namely, different graphite strips can receive different impurity ions; and the controller is connected with the rear ends of the various graphite strips to detect electrical current of each graphite strip and detect whether the impurity ions are abnormal or not, so that whether the ion source causes pollution or whether the ion source is unstable is judged and massive product pollution is avoided.