Non-volatile memory system and method with variable error correcting capability

一种非易失性存储、纠错能力的技术,应用在静态存储器、电气元件、代码转换等方向,能够解决灵活性不够、NANDFLASH纠错速度固定等问题

Inactive Publication Date: 2009-08-05
ARKMICRO TECH
View PDF0 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] In order to solve the problem that the NANDFLASH read and write control error correction speed is fixed and the flexibility is not enough in the prior art, the present invention proposes a non-volatile storage system with variable error correction capability implemented by full hardware. The system includes: Bus interface module 101, RS encoder 102, RS decoder 103 and NAND read and write timing generator 105, data is written through the system bus through bus interface module 101, RS encoder 102, NAND read and write timing generator 105 and flash memory interface The storage system performs a read operation through a flash memory interface through a NAND read and write timing generator 105, an RS decoder 103, and a bus interface module 101. It is characterized in that the system also includes an error correction capability configuration module 104, which passes the bus interface module 101 performs command input and error correction information feedback with the outside world, and the error correction capability configuration module 104 performs error correction capability configuration on the RS encoder 102 and RS decoder 103 respectively according to the instructions, and respectively configures the RS encoder 102 and RS The feedback information obtained by the decoder 103 is output through the bus interface module 101

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0034] The non-volatile storage system of the present invention takes the NANDFLASH controller as an example, and the structure of the NANDFLASH controller is as follows figure 1 As mentioned above, it includes: a system bus interface module 101 , an RS encoder 102 , an RS decoder 103 , an error correction capability configuration module 104 and a NAND read and write timing generator 105 .

[0035] Wherein, the system bus interface module 101 is an interface for realizing communication between the outside world and the system. The system bus mentioned here does not have a specific system bus, but generally refers to various system buses, such as AMBA bus, WISHBONE bus and so on.

[0036] The RS encoder 102 and the RS decoder 103 are the main modules for realizing the RS error correction algorithm. As an error correction code that has bee...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a nonvalatile memory system with variable error correcting capability, which comprises a system bus interface module, an RS encoder, an RS decoder, an NAND read-write time sequence generator and an error correcting capability configuration module. The error correcting capability configuration module carries out order input and error correcting information feedback with outside world through the bus interface module. The error correcting capability configuration module carries out error correcting capability configuration to the RS encoder and the RS decoder respectively in accordance with instructions and outputs feedback information obtained from the RS encoder and the RS decoder respectively through the bus interface module. The system takes both speed and error correcting capacity into consideration, thus realizing the error correcting capacity adjustment in various environments so as to obtain the best error correcting configuration.

Description

technical field [0001] The invention relates to a structure for enabling a non-volatile storage system to have an error correction function and an error correction method thereof. Background technique [0002] In modern digital systems, it is often necessary to store large-capacity data. In addition to traditional magnetic substances as storage media, various semiconductor storage devices have appeared one after another with the development of semiconductor technology. However, due to the characteristics of semiconductor devices, some bit errors will be introduced in the process of manufacturing and use. With the increase of its capacity, the commonly used flash memory NANDFLASH has a higher probability of error. Therefore, it is necessary to read and write the flash memory NANDFLASH In operation, an additional error-correcting code is generally used. [0003] Generally speaking, the error correction code used in flash memory NAND FLASH devices is generally Hamming code, wh...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/42G11C29/40H03M7/30
Inventor 吴焯焰郑涛常军锋刘俊秀石岭
Owner ARKMICRO TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products