Semiconductor chip test system and method
一种芯片测试、半导体的技术,应用在半导体芯片测试接口器件的检测领域,能够解决昂贵、耗费测试时间等问题,达到降低数量、缩短停机时间、降低成本的效果
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment Construction
[0015] In the following description, several specific details are set forth. However, embodiments as described herein may be practiced without some of the specific details. In particular embodiments, well-known structures and techniques have not been shown in detail in order not to obscure the understanding of the description.
[0016] figure 1 A block diagram of a semiconductor chip testing system 10 according to one embodiment of the present invention is shown. The semiconductor chip test system 10 includes a robot arm 11 , a test interface device 12 , a test circuit 13 , an image acquisition device 14 , a processor 15 and a controller 16 .
[0017] The robotic arm 11 is used to pick up a semiconductor chip to be tested, such as a wafer to be tested or a packaged die, and place the semiconductor chip in the test interface device 12 or remove it from the test interface device 12 . In some cases, the robot arm 11 may be omitted from the semiconductor chip testing system 10 ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap